A Microcontroller System for the Automation of Transient Effect Determination of the Spin-Lattice Relaxation Time Using Continuous Wave NMR

A simple transient effect method for the determination of the spin-lattice relaxation time using continuous wave NMR (TEDSpiL) with a marginal oscillator was recently reported (doi:10.1002/mrc.4594). Such a system measures a parameter called Tx that is related to T1 and allows T1 to be determined with the aid of calibration samples. For such a system, the process of making the Tx measurement does not require variable parameters and so is ideal for implementing in microcontroller code. In this article, we demonstrate that TEDSpiL may be automated using two microcontrollers from the Teensy family to make a low power and portable system.