Specification for push-button switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications

2015 ◽  
Author(s):  
K. Shiraishi ◽  
T. Katsuta ◽  
S. Ozasa ◽  
H. Todokoro

We have recently completed a newly designed 650KV electron microscope. An external view of this advanced instrument is shown in Figure 1. A symmetrical Cockcroft-Walton circuit has been adopted as the high voltage generator. The cathode is heated by high frequency power; a battery is not employed. The high voltage stability is better than 1 x 10-5/min.The sectional diagram of the column shown in Figure 2 is 420mm in diameter and 2750mm in height. The illuminating system consists of a double condenser lens and a magnetic alignment device. Dual deflector assemblies for dark and bright field images, selectable by push button, are built beneath the condenser lens. Two selectable stigmator power supplies are also provided for dark and bright field image operation.


Author(s):  
Ralph Oralor ◽  
Pamela Lloyd ◽  
Satish Kumar ◽  
W. W. Adams

Small angle electron scattering (SAES) has been used to study structural features of up to several thousand angstroms in polymers, as well as in metals. SAES may be done either in (a) long camera mode by switching off the objective lens current or in (b) selected area diffraction mode. In the first case very high camera lengths (up to 7Ø meters on JEOL 1Ø ØCX) and high angular resolution can be obtained, while in the second case smaller camera lengths (approximately up to 3.6 meters on JEOL 1Ø ØCX) and lower angular resolution is obtainable. We conducted our SAES studies on JEOL 1ØØCX which can be switched to either mode with a push button as a standard feature.


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