Small-Angle Electron Scattering (SAES) of Polymers
1985 ◽
Vol 43
◽
pp. 78-79
Keyword(s):
Small angle electron scattering (SAES) has been used to study structural features of up to several thousand angstroms in polymers, as well as in metals. SAES may be done either in (a) long camera mode by switching off the objective lens current or in (b) selected area diffraction mode. In the first case very high camera lengths (up to 7Ø meters on JEOL 1Ø ØCX) and high angular resolution can be obtained, while in the second case smaller camera lengths (approximately up to 3.6 meters on JEOL 1Ø ØCX) and lower angular resolution is obtainable. We conducted our SAES studies on JEOL 1ØØCX which can be switched to either mode with a push button as a standard feature.
1997 ◽
Vol 30
(5)
◽
pp. 849-853
◽
2016 ◽
Vol 05
(01)
◽
pp. 1640003
◽
Keyword(s):
1994 ◽
Vol 154
◽
pp. 603-608
2002 ◽
Vol 206
◽
pp. 27-34
2000 ◽
Vol 175
◽
pp. 174-177
◽
1994 ◽
Vol 158
◽
pp. 201-203
Keyword(s):