The characterization of hydrogenated amorphous silicon and epitaxial silicon thin films grown on crystalline silicon substrates by using spectroscopic ellipsometry

Silicon Substrates ◽

Epitaxial Silicon ◽

Silicon Thin Films ◽

Laser crystallization and structural characterization of hydrogenated amorphous silicon thin films

Journal of Applied Physics ◽

10.1063/1.370607 ◽

1999 ◽

Vol 85 (11) ◽

pp. 7914-7918 ◽

Cited By ~ 44

Author(s):

D. Toet ◽

P. M. Smith ◽

T. W. Sigmon ◽

T. Takehara ◽

C. C. Tsai ◽

...

Keyword(s):

Thin Films ◽

Amorphous Silicon ◽

Structural Characterization ◽

Laser Crystallization ◽

Silicon Thin Films ◽

Infrared dielectric functions of hydrogenated amorphous silicon thin films determined by spectroscopic ellipsometry

2012 38th IEEE Photovoltaic Specialists Conference ◽

10.1109/pvsc.2012.6318239 ◽

2012 ◽

Author(s):

David B. Saint John ◽

Haoting Shen ◽

Hang-Beum Shin ◽

Thomas N. Jackson ◽

Nikolas J. Podraza

Keyword(s):

Thin Films ◽

Amorphous Silicon ◽

Spectroscopic Ellipsometry ◽

Silicon Thin Films ◽

Optical characterization of hydrogenated amorphous silicon thin films deposited at high rate

Journal of Electronic Materials ◽

10.1007/s11664-999-0140-9 ◽

1999 ◽

Vol 28 (12) ◽

pp. 1452-1456 ◽

Cited By ~ 9

Author(s):

S. H. Lin ◽

Y. C. Chan ◽

D. P. Webb ◽

Y. W. Lam

Keyword(s):

Thin Films ◽

Amorphous Silicon ◽

Optical Characterization ◽

High Rate ◽

Silicon Thin Films ◽

Preparation and characterization of hydrogenated amorphous silicon thin films and thin film solar cells produced by ion plating techniques. First quarterly progress report, 1 January 1979-31 March 1979

10.2172/6661085 ◽

1979 ◽

Author(s):

F H Cocks ◽

P L Jones ◽

L J Dimmey

Keyword(s):

Thin Film ◽

Thin Films ◽

Amorphous Silicon ◽

Progress Report ◽

Thin Film Solar Cells ◽

Ion Plating ◽

Silicon Thin Films ◽

Preparation and characterization of hydrogenated amorphous silicon thin films and thin film solar cells produced by ion plating techniques. Second quarterly progress report, 1 April-30 June 1979

10.2172/5758073 ◽

1979 ◽

Author(s):

F H Cocks ◽

P L Jones ◽

L Dimmey

Keyword(s):

Thin Film ◽

Thin Films ◽

Amorphous Silicon ◽

Progress Report ◽

Thin Film Solar Cells ◽

Ion Plating ◽

Silicon Thin Films ◽

In-guide pump and probe characterization of photoinduced absorption in hydrogenated amorphous silicon thin films

Journal of Applied Physics ◽

10.1063/1.2219900 ◽

2006 ◽

Vol 100 (3) ◽

pp. 033104 ◽

Cited By ~ 7

Author(s):

Francesco Giuseppe Della Corte ◽

Massimo Gagliardi ◽

Maria Arcangela Nigro ◽

Caterina Summonte

Keyword(s):

Thin Films ◽

Amorphous Silicon ◽

Photoinduced Absorption ◽

Silicon Thin Films ◽

Pump And Probe ◽

Preparation and characterization of hydrogenated amorphous silicon thin films and thin film solar cells produced by ion plating techniques. Final report, 1 January 1979-31 May 1980

10.2172/6626066 ◽

1980 ◽

Author(s):

Keyword(s):

Thin Film ◽

Thin Films ◽

Amorphous Silicon ◽

Thin Film Solar Cells ◽

Final Report ◽

Ion Plating ◽

Silicon Thin Films ◽

Characterization of hydrogenated amorphous silicon thin films prepared by magnetron sputtering

Journal of Non-Crystalline Solids ◽

10.1016/j.jnoncrysol.2005.11.023 ◽

2006 ◽

Vol 352 (1) ◽

pp. 18-23 ◽

Cited By ~ 14

Author(s):

Maruf Hossain ◽

Husam H. Abu-Safe ◽

Hameed Naseem ◽

William D. Brown

Keyword(s):

Thin Films ◽

Magnetron Sputtering ◽

Amorphous Silicon ◽

Silicon Thin Films ◽

Characterization of hydrogenated amorphous silicon thin films prepared by PECVD

10.1117/12.783345 ◽

2007 ◽

Author(s):

Zhi-Ming Wu ◽

Shi-Bin Li ◽

Wei Li ◽

Nai-Man Niao ◽

Ya-Dong Jiang ◽

...

Keyword(s):

Thin Films ◽

Amorphous Silicon ◽

Silicon Thin Films ◽

Raman and ellipsometric characterization of hydrogenated amorphous silicon thin films

Science in China Series E ◽

10.1007/s11431-008-0196-4 ◽

2008 ◽

Vol 52 (2) ◽

pp. 339-343 ◽

Cited By ~ 4

Author(s):

NaiMan Liao ◽

Wei Li ◽

YueJun Kuang ◽

YaDong Jiang ◽

ShiBin Li ◽

...

Keyword(s):

Thin Films ◽

Amorphous Silicon ◽

Silicon Thin Films ◽

Ellipsometric Characterization ◽