Flatband voltage stability and time to failure of MOCVD-grown SiO2 and Si3N4 dielectrics on N-polar GaN
2008 ◽
Vol 128
(11)
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pp. 1320-1328
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2016 ◽
Vol 9
(2)
◽
pp. 128
2016 ◽
Vol 11
(4)
◽
pp. 428
2016 ◽
Vol 11
(1)
◽
pp. 109
Keyword(s):
2017 ◽
Vol 10
(4)
◽
pp. 268
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Keyword(s):