Scanning Tunneling Microscopy Study of the Bipolar Resistance Switching Characteristics of Nanoscopic Conductive Filament for HfO2-based MIM stack

2014 ◽  
Author(s):  
K.S. Yew ◽  
Y. Zhou ◽  
D.S. Ang
Langmuir ◽  
2009 ◽  
Vol 25 (23) ◽  
pp. 13606-13613 ◽  
Author(s):  
Florian Mögele ◽  
Donato Fantauzzi ◽  
Ulf Wiedwald ◽  
Paul Ziemann ◽  
Bernhard Rieger

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