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Author(s):  
P. Lu ◽  
F. Cosandey

High-resolution electron microscopy (HREM) has been used to provide information on atomic structures of metal/oxide interfaces, which are of both scientific and technological interest. In this report, we present results of a study on Fe/TiO2 and Cu/TiO2 interfaces by HREM. The Fe/TiO2 and Cu/TiO2 interfaces were formed by vapor deposition of Fe and Cu on TiO2 (110) surface, respectively, in a UHV chamber with a base pressure of ∽1x10−10 torr. Cross sectional HREM specimens were prepared using standard techniques involving mechanical polishing, dimpling and ion-milling. The samples were examined in an Topcon-002B high-resolution electron microscope. HREM simulations were performed using the EMS program.Figs, 1a and 1b show a HREM micrograph and a select area diffraction pattern of Fe/TiO2 interface, respectively, taken along the TiO2 [001] direction. From Fig.la and Fig.1b, the following orientation relationship is obtained: [001]Fe//[001]TiO2 and (100)Fe//(110)TiO2. With this orientation, there is about 12.6% lattice misfitt along the TiO2 [10] direction.


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