ohmic quality
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Electromagnetic analysis of ohmic quality factor of corrugated coaxial cavity structure for MILO

2020 URSI Regional Conference on Radio Science ( URSI-RCRS) ◽

10.23919/ursircrs49211.2020.9113628 ◽

2020 ◽

Author(s):

Arjun Kumar ◽

Prabhakar Tripathi ◽

Smrity Dwivedi ◽

P. K. Jain

Keyword(s):

Quality Factor ◽

Electromagnetic Analysis ◽

Coaxial Cavity ◽

Cavity Structure ◽

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Analysis of Ohmic Quality Factor of Circumferentially Corrugated Circular Cavities

Journal of Infrared Millimeter and Terahertz Waves ◽

10.1007/s10762-009-9604-5 ◽

2009 ◽

Author(s):

Vishal Kesari ◽

Neetesh Purohit ◽

M. Thumm

Keyword(s):

Quality Factor ◽

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A Simple Electromagnetic Analysis for Ohmic Quality Factor and RF Efficiency for 42 GHz, TE03-mode, Feebly Tapered Gyrotron Cavity

2007 Asia-Pacific Microwave Conference ◽

10.1109/apmc.2007.4554880 ◽

2007 ◽

Author(s):

Vishal Kesari

Keyword(s):

Quality Factor ◽

Electromagnetic Analysis ◽

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Eigenmodes and Ohmic quality factor of a tapered cavity resonator

2007 Joint 32nd International Conference on Infrared and Millimeter Waves and the 15th International Conference on Terahertz Electronics ◽

10.1109/icimw.2007.4516682 ◽

2007 ◽

Author(s):

R.K. Singh ◽

P.K. Jain ◽

B.N. Basu

Keyword(s):

Quality Factor ◽

Cavity Resonator ◽

Tapered Cavity ◽

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Analysis of ohmic quality factor for the Azimuthally Symmetrical TE03-mode 42GHz gyrotron cavity

2007 International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications ◽

10.1109/mape.2007.4393626 ◽

2007 ◽

Author(s):

R.K. Singh ◽

P.K. Jain ◽

B.N. Basu

Keyword(s):

Quality Factor ◽

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Ohmic quality of resonators shaped by corrugated guide sections at frequencies near bragg stop bands

International Journal of Infrared and Millimeter Waves ◽

10.1007/bf02677997 ◽

1997 ◽

Vol 18 (3) ◽

pp. 595-603 ◽

Author(s):

G. G. Denisov ◽

D. A. Lukovnikov

Keyword(s):

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Refractory Ohmic Contacts Formed by Electroless Deposition of Palladium and Nickel Onto N-InP

MRS Proceedings ◽

10.1557/proc-260-543 ◽

1992 ◽

Vol 260 ◽

Author(s):

G. Stremsdoerfer ◽

Y. Wang ◽

J. R. Martin ◽

E. Souteyrand

Keyword(s):

Chemical Process ◽

Ohmic Contacts ◽

Electroless Deposition ◽

Structural Characteristics ◽

Inp Substrates ◽

ABSTRACTNi and Pd layers have been elaborated from chemical process on (100) oriented and 1018 doped n-InP substrates. The electrical and structural characteristics of these contacts have been investigated. Good refractory ohmic contacts were obtained by the annealing of these heterostructures. The ohmic quality of chemical contacts as well as those obtained with evaporated contacts is attributed to both the presence of crystallized compounds (NiP; Ni2P; PdIn3 and Pdln) and to superficial degenerescence of InP due to a phosphorus excess laying in the interphase.

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