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Characterization of Semiconductor Heterostructures and Nanostructures
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Published By Elsevier
9780444530998
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X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures
Characterization of Semiconductor Heterostructures and Nanostructures
◽
10.1016/b978-0-444-53099-8.00009-9
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2008
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pp. 289-330
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Cited By ~ 12
Author(s):
Federico Boscherini
Keyword(s):
Fine Structure
◽
Semiconductor Heterostructures
◽
X Ray
◽
Absorption Fine
◽
X Ray Absorption
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Nanostructures in the light of synchrotron radiation: surface-sensitive X-ray techniques and anomalous scattering
Characterization of Semiconductor Heterostructures and Nanostructures
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10.1016/b978-0-444-53099-8.00010-5
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2008
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pp. 331-369
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Cited By ~ 3
Author(s):
Till Metzger
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Vincent Favre-Nicolin
◽
Gilles Renaud
◽
Hubert Renevier
◽
Tobias Schülli
Keyword(s):
Synchrotron Radiation
◽
Anomalous Scattering
◽
X Ray
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Introduction: the interdisciplinary nature of nanotechnology and its need to exploit frontier characterization techniques
Characterization of Semiconductor Heterostructures and Nanostructures
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10.1016/b978-0-444-53099-8.00001-4
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2008
◽
pp. 1-15
Author(s):
Carlo Lamberti
Keyword(s):
Characterization Techniques
◽
Interdisciplinary Nature
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Copyright
Characterization of Semiconductor Heterostructures and Nanostructures
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10.1016/b978-0-444-53099-8.50002-5
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2008
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pp. iv
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Dedication
Characterization of Semiconductor Heterostructures and Nanostructures
◽
10.1016/b978-0-444-53099-8.00014-2
◽
2008
◽
pp. v
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Electrical characterization of nanostructures
Characterization of Semiconductor Heterostructures and Nanostructures
◽
10.1016/b978-0-444-53099-8.00003-8
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2008
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pp. 55-91
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Cited By ~ 2
Author(s):
Anna Cavallini
◽
Laura Polenta
Keyword(s):
Electrical Characterization
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Color Plates
Characterization of Semiconductor Heterostructures and Nanostructures
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10.1016/b978-0-444-53099-8.00017-8
◽
2008
◽
pp. 487-489
Author(s):
C LAMBERTI
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Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures
Characterization of Semiconductor Heterostructures and Nanostructures
◽
10.1016/b978-0-444-53099-8.00011-7
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2008
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pp. 371-405
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Cited By ~ 2
Author(s):
Maria Grazia Proietti
◽
Johann Coraux
◽
Hubert Renevier
Keyword(s):
Fine Structure
◽
Structural Properties
◽
Grazing Incidence
◽
Grazing Incidence Diffraction
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The role of photoemission spectroscopies in heterojunction research
Characterization of Semiconductor Heterostructures and Nanostructures
◽
10.1016/b978-0-444-53099-8.00012-9
◽
2008
◽
pp. 407-433
Author(s):
Giorgio Margaritondo
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Preface
Characterization of Semiconductor Heterostructures and Nanostructures
◽
10.1016/b978-0-444-53099-8.00015-4
◽
2008
◽
pp. ix
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