Characterization of Semiconductor Heterostructures and Nanostructures
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By Elsevier

9780444530998

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Nanostructures in the light of synchrotron radiation: surface-sensitive X-ray techniques and anomalous scattering

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-53099-8.00010-5 ◽

2008 ◽

pp. 331-369 ◽

Cited By ~ 3

Author(s):

Till Metzger ◽

Vincent Favre-Nicolin ◽

Gilles Renaud ◽

Hubert Renevier ◽

Tobias Schülli

Keyword(s):

Synchrotron Radiation ◽

Anomalous Scattering ◽

X Ray

X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-53099-8.00009-9 ◽

2008 ◽

pp. 289-330 ◽

Cited By ~ 12

Author(s):

Federico Boscherini

Keyword(s):

Fine Structure ◽

Semiconductor Heterostructures ◽

X Ray ◽

Absorption Fine ◽

X Ray Absorption

Copyright

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-53099-8.50002-5 ◽

2008 ◽

pp. iv

Dedication

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-53099-8.00014-2 ◽

2008 ◽

pp. v

Electrical characterization of nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-53099-8.00003-8 ◽

2008 ◽

pp. 55-91 ◽

Cited By ~ 2

Author(s):

Anna Cavallini ◽

Laura Polenta

Keyword(s):

Electrical Characterization

Introduction: the interdisciplinary nature of nanotechnology and its need to exploit frontier characterization techniques

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-53099-8.00001-4 ◽

2008 ◽

pp. 1-15

Author(s):

Carlo Lamberti

Keyword(s):

Characterization Techniques ◽

Interdisciplinary Nature

Color Plates

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-53099-8.00017-8 ◽

2008 ◽

pp. 487-489

Author(s):

C LAMBERTI

The role of photoemission spectroscopies in heterojunction research

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-53099-8.00012-9 ◽

2008 ◽

pp. 407-433

Author(s):

Giorgio Margaritondo

Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-53099-8.00011-7 ◽

2008 ◽

pp. 371-405 ◽

Cited By ~ 2

Author(s):

Maria Grazia Proietti ◽

Johann Coraux ◽

Hubert Renevier

Keyword(s):

Fine Structure ◽

Structural Properties ◽

Grazing Incidence ◽

Grazing Incidence Diffraction

Preface

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-53099-8.00015-4 ◽

2008 ◽

pp. ix

Characterization of Semiconductor Heterostructures and NanostructuresLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Elsevier

Nanostructures in the light of synchrotron radiation: surface-sensitive X-ray techniques and anomalous scattering

X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures

Copyright

Dedication

Electrical characterization of nanostructures

Introduction: the interdisciplinary nature of nanotechnology and its need to exploit frontier characterization techniques

Color Plates

The role of photoemission spectroscopies in heterojunction research

Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures

Preface

Characterization of Semiconductor Heterostructures and Nanostructures
Latest Publications