2006 43rd ACM/IEEE Design Automation Conference
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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

An IC manufacturing yield model considering intra-die variations

2006 ◽  
Author(s):  
J. Luo ◽  
S. Sinha ◽  
Q. Su ◽  
J. Kawa ◽  
C. Chiang
Keyword(s):  
Yield Model ◽  
Ic Manufacturing ◽  
Manufacturing Yield

Entering the hot zone

2006 ◽  
Author(s):  
A. Yang ◽  
R. Chandra ◽  
S. Burke ◽  
J. A. DeLaCruz ◽  
S. Santhanam ◽  
...  
Keyword(s):  
Hot Zone

scholarly journals DAG-aware AIG rewriting: a fresh look at combinational logic synthesis

2006 ◽  
Author(s):  
A. Mishchenko ◽  
S. Chatterjee ◽  
R. Brayton
Keyword(s):  
Logic Synthesis ◽  
Combinational Logic

Overview of the MPSoC design challenge

2006 ◽  
Author(s):  
Grant Martin
Keyword(s):  
Design Challenge

Transistor abstraction for the functional verification of FPGAs

2006 ◽  
Author(s):  
G. Dupenloup ◽  
T. Lemeunier ◽  
R. Mayr
Keyword(s):  
Functional Verification

Multiple-detect ATPG based on physical neighborhoods

2006 ◽  
Author(s):  
J.E. Nelson ◽  
J.G. Brown ◽  
R. Desineni ◽  
R.D. Blanton

Criticality computation in parameterized statistical timing

2006 ◽  
Author(s):  
Jinjun Xiong ◽  
Vladimir Zolotov ◽  
Natesan Venkateswaran ◽  
Chandu Visweswariah
Keyword(s):  
Statistical Timing

Topology aware mapping of logic functions onto nanowire-based crossbar architectures

2006 ◽  
Author(s):  
Wenjing Rao ◽  
Alex Orailoglu ◽  
Ramesh Karri
Keyword(s):  
Logic Functions

Scheduling-based test-case generation for verification of multimedia SoCs

2006 ◽  
Author(s):  
Amir Nahir ◽  
Avi Ziv ◽  
R. Emek ◽  
Tal Keidar ◽  
Nir Ronen
Keyword(s):  
Test Case Generation ◽  
Test Case
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