silicon debug
Recently Published Documents

TOTAL DOCUMENTS

148

(FIVE YEARS 2)

H-INDEX

(FIVE YEARS 0)

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Dataset development of GPU block using Scan Dump for Silicon Debug

2021 6th International Conference on Communication and Electronics Systems (ICCES) ◽

10.1109/icces51350.2021.9489220 ◽

2021 ◽

Author(s):

Karthik S Kulkarni ◽

H. V. Ravish Aradhya

Keyword(s):

Silicon Debug

On-Chip Error Detection Reusing Built-in Self-Repair for Silicon Debug

IEEE Access ◽

10.1109/access.2021.3071517 ◽

2021 ◽

pp. 1-1

Author(s):

Hayoung Lee ◽

Hyunggoy Oh ◽

Sungho Kang

Keyword(s):

Error Detection ◽

Self Repair ◽

On Chip ◽

Silicon Debug

A Methodology to Capture Fine-Grained Internal Visibility During Multisession Silicon Debug

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2019.2958989 ◽

2020 ◽

Vol 28 (4) ◽

pp. 1002-1015

Author(s):

Binod Kumar ◽

Jay Adhaduk ◽

Kanad Basu ◽

Masahiro Fujita ◽

Virendra Singh

Keyword(s):

Fine Grained ◽

Silicon Debug

Combinational Hybrid Signal Selection With Updated Reachability Lists for Post-Silicon Debug

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2018.2883969 ◽

2020 ◽

Vol 39 (1) ◽

pp. 272-276

Author(s):

Siamack Beigmohammadi ◽

Bijan Alizadeh

Keyword(s):

Signal Selection ◽

Silicon Debug

WiND: An Efficient Post-Silicon Debug Strategy for Network-on-Chip

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2020.3044897 ◽

2020 ◽

pp. 1-1

Author(s):

Sidhartha Sankar Rout ◽

Sujay Deb ◽

Kanad Basu

Keyword(s):

Network On Chip ◽

On Chip ◽

Silicon Debug

Scan Based Silicon Debug

ECS Transactions ◽

10.1149/1.3694424 ◽

2019 ◽

Vol 44 (1) ◽

pp. 1021-1027

Author(s):

Yu Huang

Keyword(s):

Silicon Debug

SAT-based Silicon Debug of Electrical Errors under Restricted Observability Enhancement

Journal of Electronic Testing ◽

10.1007/s10836-019-05830-y ◽

2019 ◽

Vol 35 (5) ◽

pp. 655-678 ◽

Cited By ~ 1

Author(s):

Binod Kumar ◽

Masahiro Fujita ◽

Virendra Singh

Keyword(s):

Silicon Debug

Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2018.2818690 ◽

2019 ◽

Vol 38 (4) ◽

pp. 767-779 ◽

Cited By ~ 1

Author(s):

Yun Cheng ◽

Huawei Li ◽

Ying Wang ◽

Xiaowei Li

Keyword(s):

Signal Selection ◽

Selection For ◽

Silicon Debug

Attack on Trace Buffer: A Study on Observability versus Security in Post-Silicon Debug

2019 International Conference on Communication and Signal Processing (ICCSP) ◽

10.1109/iccsp.2019.8698022 ◽

2019 ◽

Author(s):

Agalya Rajendran ◽

Muthaiah Rajappa

Keyword(s):

Silicon Debug

Innovative Practices on Software and Hardware based Silicon Debug/Fault Isolation

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758654 ◽

2019 ◽

Author(s):

Amit Jakati ◽

Manish Sharma ◽

Joy Liao

Keyword(s):

Fault Isolation ◽

Software And Hardware ◽

Silicon Debug

silicon debugRecently Published Documents

TOTAL DOCUMENTS

H-INDEX

Dataset development of GPU block using Scan Dump for Silicon Debug

On-Chip Error Detection Reusing Built-in Self-Repair for Silicon Debug

A Methodology to Capture Fine-Grained Internal Visibility During Multisession Silicon Debug

Combinational Hybrid Signal Selection With Updated Reachability Lists for Post-Silicon Debug

WiND: An Efficient Post-Silicon Debug Strategy for Network-on-Chip

Scan Based Silicon Debug

SAT-based Silicon Debug of Electrical Errors under Restricted Observability Enhancement

Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug

Attack on Trace Buffer: A Study on Observability versus Security in Post-Silicon Debug

Innovative Practices on Software and Hardware based Silicon Debug/Fault Isolation

silicon debug
Recently Published Documents