2021 IEEE Microelectronics Design & Test Symposium (MDTS)
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9781665424806
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Large-Scale Thermal TCAD Simulations of 7nm Circuits

2021 ◽  
Author(s):  
J. Greg Massey ◽  
Lan Luo ◽  
Peter Smith ◽  
Richard Wachnik
Keyword(s):  
Large Scale ◽  
Tcad Simulations

Opportunities and Limitations of in-Memory Multiply-and-Accumulate Arrays

2021 ◽  
Author(s):  
Ruoyu Zhi ◽  
Ryan Jurasek ◽  
Wolfgang Hokenmaier ◽  
Don Labrecque ◽  
Jacob Bucci ◽  
...  

High Throughput Multiple Device Chain Diagnosis Methodology for Clock and Control Line Defects

2021 ◽  
Author(s):  
Bharath Nandakumar ◽  
Sameer Chillarige ◽  
Nicholai L' Esperance ◽  
Robert Redburn
Keyword(s):  
High Throughput ◽  
Control Line ◽  
Line Defects ◽  
And Control

Detection of Field Failure Chips by Ensemble Learned from Different Chip Areas

2021 ◽  
Author(s):  
Min-Soo Kim ◽  
Jong-Seok Lee ◽  
Jung-Hoon Chun
Keyword(s):  
Field Failure

Compensating Detection Latency of FPGA Scrubbers with a Collaborative Functional Hardware Duplication

2021 ◽  
Author(s):  
Mohammad Reza Naeemi Khaledi ◽  
Mohammad Ebrahimi ◽  
Zainalabedin Navabi
Keyword(s):  
Detection Latency
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