2021 IEEE Microelectronics Design & Test Symposium (MDTS)
Latest Publications

TOTAL DOCUMENTS

15

(FIVE YEARS 15)

H-INDEX

0

(FIVE YEARS 0)

Published By IEEE

9781665424806

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Large-Scale Thermal TCAD Simulations of 7nm Circuits

2021 IEEE Microelectronics Design & Test Symposium (MDTS) ◽

10.1109/mdts52103.2021.9476141 ◽

2021 ◽

Author(s):

J. Greg Massey ◽

Lan Luo ◽

Peter Smith ◽

Richard Wachnik

Keyword(s):

Large Scale ◽

Tcad Simulations

Download Full-text

Opportunities and Limitations of in-Memory Multiply-and-Accumulate Arrays

2021 IEEE Microelectronics Design & Test Symposium (MDTS) ◽

10.1109/mdts52103.2021.9476104 ◽

2021 ◽

Author(s):

Ruoyu Zhi ◽

Ryan Jurasek ◽

Wolfgang Hokenmaier ◽

Don Labrecque ◽

Jacob Bucci ◽

...

Download Full-text

Front Matter

2021 IEEE Microelectronics Design & Test Symposium (MDTS) ◽

10.1109/mdts52103.2021.9476087 ◽

2021 ◽

Download Full-text

Pre-Amplifier Based Entropy Source with Stable Output for use in a Physical Unclonable Function

2021 IEEE Microelectronics Design & Test Symposium (MDTS) ◽

10.1109/mdts52103.2021.9476114 ◽

2021 ◽

Author(s):

Eric Hunt-Schroeder ◽

Tian Xia

Keyword(s):

Physical Unclonable Function ◽

Download Full-text

Principal Component Analysis in Machine Intelligence-Based Test Generation

2021 IEEE Microelectronics Design & Test Symposium (MDTS) ◽

10.1109/mdts52103.2021.9476085 ◽

2021 ◽

Author(s):

Soham Roy ◽

Spencer K. Millican ◽

Vishwani D. Agrawal

Keyword(s):

Principal Component Analysis ◽

Test Generation ◽

Principal Component ◽

Component Analysis ◽

Machine Intelligence

Download Full-text

MDTS 2021 Cover Page

2021 IEEE Microelectronics Design & Test Symposium (MDTS) ◽

10.1109/mdts52103.2021.9476092 ◽

2021 ◽

Download Full-text

Compensating Detection Latency of FPGA Scrubbers with a Collaborative Functional Hardware Duplication

2021 IEEE Microelectronics Design & Test Symposium (MDTS) ◽

10.1109/mdts52103.2021.9476122 ◽

2021 ◽

Author(s):

Mohammad Reza Naeemi Khaledi ◽

Mohammad Ebrahimi ◽

Zainalabedin Navabi

Keyword(s):

Detection Latency

Download Full-text

High Throughput Multiple Device Chain Diagnosis Methodology for Clock and Control Line Defects

2021 IEEE Microelectronics Design & Test Symposium (MDTS) ◽

10.1109/mdts52103.2021.9476086 ◽

2021 ◽

Author(s):

Bharath Nandakumar ◽

Sameer Chillarige ◽

Nicholai L' Esperance ◽

Robert Redburn

Keyword(s):

High Throughput ◽

Control Line ◽

Line Defects ◽

Download Full-text

Detection of Field Failure Chips by Ensemble Learned from Different Chip Areas

2021 IEEE Microelectronics Design & Test Symposium (MDTS) ◽

10.1109/mdts52103.2021.9476101 ◽

2021 ◽

Author(s):

Min-Soo Kim ◽

Jong-Seok Lee ◽

Jung-Hoon Chun

Keyword(s):

Download Full-text

Copyright Page

2021 IEEE Microelectronics Design & Test Symposium (MDTS) ◽

10.1109/mdts52103.2021.9476105 ◽

2021 ◽

Download Full-text