2009 International Test Conference
Latest Publications

TOTAL DOCUMENTS

116

(FIVE YEARS 0)

H-INDEX

12

(FIVE YEARS 0)

Published By IEEE

9781424448685

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Using transition test to understand timing behavior of logic circuits on UltraSPARCTM T2 family

2009 International Test Conference ◽

10.1109/test.2009.5355655 ◽

2009 ◽

Cited By ~ 5

Author(s):

Liang-Chi Chen ◽

Paul Dickinson ◽

Peter Dahlgren ◽

Scott Davidson ◽

Olivier Caty ◽

...

Keyword(s):

Logic Circuits ◽

Timing Behavior

Download Full-text

Testing bridges to nowhere - combining Boundary Scan and capacitive sensing

2009 International Test Conference ◽

10.1109/test.2009.5355662 ◽

2009 ◽

Cited By ~ 7

Author(s):

Stephen Sunter ◽

Kenneth P. Parker

Keyword(s):

Boundary Scan ◽

Capacitive Sensing

Download Full-text

Feature based similarity search with application to speedpath analysis

2009 International Test Conference ◽

10.1109/test.2009.5355708 ◽

2009 ◽

Cited By ~ 4

Author(s):

Nicholas Callegari ◽

Li-C. Wang ◽

Pouria Bastani

Keyword(s):

Similarity Search ◽

Feature Based

Download Full-text

A timestamping method using reduced cost ADC hardware

2009 International Test Conference ◽

10.1109/test.2009.5355736 ◽

2009 ◽

Author(s):

Timothy D. Lyons

Download Full-text

At-speed test on the QorIQTM P2020 platform

2009 International Test Conference ◽

10.1109/test.2009.5355588 ◽

2009 ◽

Author(s):

Colin D. Renfrew ◽

Brian Booth ◽

Shweta Latawa ◽

Rick Woltenberg ◽

Carol Pyron

Keyword(s):

Speed Test

Download Full-text

An economical, precise and limited access In-Circuit Test method for pulse-width modulation (PWM) circuits

2009 International Test Conference ◽

10.1109/test.2009.5355755 ◽

2009 ◽

Author(s):

Albert Yeh ◽

Jesse Chou ◽

Max Lin

Keyword(s):

Pulse Width ◽

Pulse Width Modulation ◽

Test Method ◽

Limited Access

Download Full-text

A robust method for identifying a deterministic jitter model in a total jitter distribution

2009 International Test Conference ◽

10.1109/test.2009.5355768 ◽

2009 ◽

Cited By ~ 7

Author(s):

Takahiro J. Yamaguchi ◽

Kiyotaka Ichiyama ◽

Harry X. Hou ◽

Masahiro Ishida

Keyword(s):

Robust Method ◽

Jitter Model

Download Full-text

Compression based on deterministic vector clustering of incompatible test cubes

2009 International Test Conference ◽

10.1109/test.2009.5355555 ◽

2009 ◽

Cited By ~ 15

Author(s):

G. Mrugalski ◽

N. Mukherjee ◽

J. Rajski ◽

D. Czysz ◽

J. Tyszer

Keyword(s):

Vector Clustering

Download Full-text

Physically aware DFT: Is it worth all the heavy lifting?

2009 International Test Conference ◽

10.1109/test.2009.5355910 ◽

2009 ◽

Cited By ~ 1

Author(s):

LeRoy Winemberg

Download Full-text

Running scan test on three pins: yes we can!

2009 International Test Conference ◽

10.1109/test.2009.5355693 ◽

2009 ◽

Cited By ~ 13

Author(s):

Jocel Moreau ◽

Thomas Droniou ◽

Philippe Lebourg ◽

Paul Armagnat

Keyword(s):

Scan Test

Download Full-text