2009 International Test Conference
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116
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9781424448685
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Using transition test to understand timing behavior of logic circuits on UltraSPARCTM T2 family

2009 ◽  
Author(s):  
Liang-Chi Chen ◽  
Paul Dickinson ◽  
Peter Dahlgren ◽  
Scott Davidson ◽  
Olivier Caty ◽  
...  
Keyword(s):  
Logic Circuits ◽  
Timing Behavior

Fast circuit topology based method to configure the scan chains in Illinois Scan architecture

2009 ◽  
Author(s):  
Swapneel Donglikar ◽  
Mainak Banga ◽  
Maheshwar Chandrasekar ◽  
Michael S. Hsiao
Keyword(s):  
Circuit Topology ◽  
Fast Circuit ◽  
Scan Chains

Test chip experiments at stanford CRC

2009 ◽  
Author(s):  
Ahmed Al-Yamani ◽  
Jonathan Chang ◽  
Piero Franco ◽  
James Li ◽  
Siyad Ma ◽  
...  
Keyword(s):  
Test Chip

A2DTest: A complete integrated solution for on-chip ADC self-test and analysis

2009 ◽  
Author(s):  
Brendan Mullane ◽  
Vincent O'Brien ◽  
Ciaran MacNamee ◽  
Thomas Fleischmann
Keyword(s):  
Self Test ◽  
On Chip

Fast extended test access via JTAG and FPGAs

2009 ◽  
Author(s):  
Sergei Devadze ◽  
Artur Jutman ◽  
Igor Aleksejev ◽  
Raimund Ubar

Test access mechanism for multiple identical cores

2009 ◽  
Author(s):  
Grady Giles ◽  
Jing Wang ◽  
Anuja Sehgal ◽  
Kedarnath J. Balakrishnan ◽  
James Wingfield
Keyword(s):  
Test Access Mechanism
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