Protocol Test Systems VIII
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Published By Springer US

9781475763126, 9780387349886
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scholarly journals Experiences with the Design of B-ISDN Integrated Test System(BITS)

1996 ◽  
pp. 319-328
Author(s):  
Ki Young Kim ◽  
Weon Soon Kim ◽  
Beom Kee Hong
Keyword(s):  
Test System

scholarly journals Towards testable communication software

1996 ◽  
pp. 237-251 ◽  
Author(s):  
R. Dssouli ◽  
K. Karoui ◽  
A. Petrenko ◽  
O. Rafiq
Keyword(s):  
Communication Software

scholarly journals Management and maintenance of TTCN Abstract Test Suites

1996 ◽  
pp. 358-366
Author(s):  
Pierre-Yves Danet ◽  
Etienne Desécures
Keyword(s):  
Test Suites

scholarly journals Design for testability of protocols based on formal specifications

1996 ◽  
pp. 252-264 ◽  
Author(s):  
Myungchul Kim ◽  
Samuel T. Chanson ◽  
Sangjo Yoo
Keyword(s):  
Design For Testability ◽  
Formal Specifications
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