Accelerated Life Testing of One‐shot Devices
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21

(FIVE YEARS 21)

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Published By Wiley

9781119664031

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Design of Simple Step‐Stress Accelerated Life‐Tests

Accelerated Life Testing of One‐shot Devices ◽

10.1002/9781119664031.ch8 ◽

2021 ◽

pp. 119-139

Keyword(s):

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

Life Tests

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Likelihood Inference

Accelerated Life Testing of One‐shot Devices ◽

10.1002/9781119664031.ch2 ◽

2021 ◽

pp. 13-45

Keyword(s):

Likelihood Inference

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Robust Inference

Accelerated Life Testing of One‐shot Devices ◽

10.1002/9781119664031.ch5 ◽

2021 ◽

pp. 79-94

Keyword(s):

Robust Inference

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Model Mis‐Specification Analysis and Model Selection

Accelerated Life Testing of One‐shot Devices ◽

10.1002/9781119664031.ch4 ◽

2021 ◽

pp. 65-78

Keyword(s):

Model Selection ◽

Specification Analysis

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Bibliography

Accelerated Life Testing of One‐shot Devices ◽

10.1002/9781119664031.biblio ◽

2021 ◽

pp. 207-215

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Bayesian Inference

Accelerated Life Testing of One‐shot Devices ◽

10.1002/9781119664031.ch3 ◽

2021 ◽

pp. 47-63

Keyword(s):

Bayesian Inference

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Semi‐Parametric Models and Inference

Accelerated Life Testing of One‐shot Devices ◽

10.1002/9781119664031.ch6 ◽

2021 ◽

pp. 95-104

Keyword(s):

Parametric Models

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Conclusions and Future Directions

Accelerated Life Testing of One‐shot Devices ◽

10.1002/9781119664031.ch11 ◽

2021 ◽

pp. 187-190

Keyword(s):

Future Directions

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One‐Shot Devices with Dependent Components

Accelerated Life Testing of One‐shot Devices ◽

10.1002/9781119664031.ch10 ◽

2021 ◽

pp. 173-186

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One‐Shot Device Testing Data

Accelerated Life Testing of One‐shot Devices ◽

10.1002/9781119664031.ch1 ◽

2021 ◽

pp. 1-11

Keyword(s):

Testing Data

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