2014 International Test Conference
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105
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10
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Published By IEEE

9781479947225
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Efficient testing of hierarchical core-based SOCs

2014 ◽  
Author(s):  
B. Keller ◽  
K. Chakravadhanula ◽  
B. Foutz ◽  
V. Chickermane ◽  
A. Garg ◽  
...  

Board security enhancement using new locking SIB-based architectures

2014 ◽  
Author(s):  
Jennifer Dworak ◽  
Zoe Conroy ◽  
Al Crouch ◽  
John Potter
Keyword(s):  
Security Enhancement

Analytical MRAM test

2014 ◽  
Author(s):  
Raphael Robertazzi ◽  
Janusz Nowak ◽  
Jonathan Sun

Intra-die process variation aware anomaly detection in FPGAs

2014 ◽  
Author(s):  
Youngok Pino ◽  
Vinayaka Jyothi ◽  
Matthew French
Keyword(s):  
Anomaly Detection ◽  
Process Variation

Low-distortion signal generation for ADC testing

2014 ◽  
Author(s):  
Fumitaka Abe ◽  
Yutaro Kobayashi ◽  
Kenji Sawada ◽  
Keisuke Kato ◽  
Osamu Kobayashi ◽  
...  
Keyword(s):  
Signal Generation ◽  
Low Distortion ◽  
Adc Testing

IC laser trimming speed-up through wafer-level spatial correlation modeling

2014 ◽  
Author(s):  
Constantinos Xanthopoulos ◽  
Ke Huang ◽  
Abbas Poonawala ◽  
Amit Nahar ◽  
Bob Orr ◽  
...  
Keyword(s):  
Spatial Correlation ◽  
Wafer Level ◽  
Speed Up

Statistical silicon results of dynamic power integrity control of ATE for eliminating overkills and underkills

2014 ◽  
Author(s):  
Masahiro Ishida ◽  
Takashi Kusaka ◽  
Toru Nakura ◽  
Satoshi Komatsu ◽  
Kunihiro Asada
Keyword(s):  
Power Integrity ◽  
Dynamic Power
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