2018 IEEE International Reliability Physics Symposium (IRPS)
Latest Publications

TOTAL DOCUMENTS

179

(FIVE YEARS 0)

H-INDEX

9

(FIVE YEARS 0)

Published By IEEE

9781538654798

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Key attributes to achieving > 99.99 satellite availability

2018 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2018.8353620 ◽

2018 ◽

Author(s):

Brian Kosinski ◽

Ken Dodson

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Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing

2018 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2018.8353670 ◽

2018 ◽

Author(s):

D. Kocaay ◽

Ph. Roussel ◽

K. Croes ◽

I. Ciofi ◽

A. Lesniewska ◽

...

Keyword(s):

Spacing Variation ◽

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Understanding gate metal work function (mWF) impact on device reliability — A holistic approach

2018 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2018.8353646 ◽

2018 ◽

Author(s):

P. Srinivasan ◽

R. Ranjan ◽

S. Cimino ◽

A. Zainuddin ◽

B. Kannan ◽

...

Keyword(s):

Work Function ◽

Holistic Approach ◽

Metal Work Function ◽

Device Reliability ◽

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Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI

2018 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2018.8353570 ◽

2018 ◽

Author(s):

Younggeun Ji ◽

Jeonghoon Kim ◽

Jungin Kim ◽

Miji Lee ◽

Jaeheon Noh ◽

...

Keyword(s):

Cmos Image Sensor ◽

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A new method for quickly evaluating reversible and permanent components of the BTI degradation

2018 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2018.8353688 ◽

2018 ◽

Author(s):

X. Garros ◽

A. Subirats ◽

G. Reimbold ◽

F. Gaillard ◽

C. Diouf ◽

...

Keyword(s):

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On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs

2018 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2018.8353596 ◽

2018 ◽

Author(s):

Bhawani Shankar ◽

Ankit Soni ◽

Sayak Dutta Gupta ◽

R. Sengupta ◽

H. Khand ◽

...

Keyword(s):

Gan Hemts ◽

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Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors

2018 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2018.8353540 ◽

2018 ◽

Author(s):

T. Grasser ◽

B. Stampfer ◽

M. Waltl ◽

G. Rzepa ◽

K. Rupp ◽

...

Keyword(s):

Physical Modeling ◽

Temporal Evolution ◽

Interfacial States

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Hot carrier effects on the RF performance degradation of nanoscale LNA SOI nFETs

2018 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2018.8353697 ◽

2018 ◽

Author(s):

D. P. Ioannou ◽

Y. Tan ◽

R. Logan ◽

K. Bandy ◽

R. Achanta ◽

...

Keyword(s):

Performance Degradation ◽

Hot Carrier ◽

Hot Carrier Effects ◽

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An overview of autonomous vehicles safety

2018 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2018.8353618 ◽

2018 ◽

Author(s):

Riccardo Mariani

Keyword(s):

Autonomous Vehicles

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High-density fan-out technology for advanced SiP and 3D heterogeneous integration

2018 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2018.8353588 ◽

2018 ◽

Author(s):

KangWook Lee

Keyword(s):

High Density ◽

Heterogeneous Integration

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