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[1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
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Published By IEEE
0780312120
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Uniformity measures in semiconductor manufacturing
[1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
◽
10.1109/ismss.1993.263708
◽
2002
◽
Author(s):
A.M. Hurwitz
Keyword(s):
Semiconductor Manufacturing
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Particle concentrations over production tools during processing; a comparison of facilities worldwide
[1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
◽
10.1109/ismss.1993.263699
◽
2002
◽
Author(s):
S. Abuzeid
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How to implement a customer satisfaction survey to drive your MIS organization
[1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
◽
10.1109/ismss.1993.263690
◽
2002
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Author(s):
S.D. Aulds
Keyword(s):
Customer Satisfaction
◽
Satisfaction Survey
◽
Customer Satisfaction Survey
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A prospectus for gigascale integration (GSI)
[1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
◽
10.1109/ismss.1993.263706
◽
2002
◽
Author(s):
J.D. Meindl
Keyword(s):
Gigascale Integration
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Product evolution vs. product revolution maximizing continuous improvement while minimizing risk
[1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
◽
10.1109/ismss.1993.263691
◽
2002
◽
Author(s):
E.A. Englhardt
Keyword(s):
Continuous Improvement
◽
Product Evolution
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Building effective alliances
[1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
◽
10.1109/ismss.1993.263695
◽
2002
◽
Author(s):
C.F. Painter
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Programmable factory IC manufacturing for the 21st century
[1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
◽
10.1109/ismss.1993.263709
◽
2002
◽
Cited By ~ 1
Author(s):
K.C. Saraswat
Keyword(s):
21St Century
◽
Ic Manufacturing
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Key factors in designing a manufacturing line to maximize tool utilization and minimize turnaround time
[1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
◽
10.1109/ismss.1993.263701
◽
2002
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Cited By ~ 6
Author(s):
D.P. Martin
Keyword(s):
Turnaround Time
◽
Key Factors
◽
Manufacturing Line
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In situ particle monitoring in a single wafer poly silicon and silicon nitride etch system
[1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
◽
10.1109/ismss.1993.263705
◽
2002
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Cited By ~ 2
Author(s):
B. Busselman
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T. Emery
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K. Staker
◽
K. Heiman
◽
D. Tran
◽
...
Keyword(s):
Silicon Nitride
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Poly Silicon
◽
Particle Monitoring
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The development and implementation of a cell controller framework
[1993 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
◽
10.1109/ismss.1993.263700
◽
2002
◽
Cited By ~ 5
Author(s):
K. Nguyen
Keyword(s):
A Cell
◽
Cell Controller
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