2019 IEEE International Test Conference India (ITC India)
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9781728105734
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Demonstration of On-Chip Test Decompression for EDT using Binary Encoded Neural Autoencoders

2019 ◽  
Author(s):  
Philemon Daniel ◽  
Shaily Singh ◽  
Garima Gill ◽  
Anshu Gangwar ◽  
Bargaje Ganesh ◽  
...  
Keyword(s):  
On Chip

Applications of Test Techniques for Improving Silicon to Pre-Silicon Timing Correlation

2019 ◽  
Author(s):  
Reecha Jajodia ◽  
Sarvesh Sharma ◽  
Jaison Kurien ◽  
Kevin Zhou ◽  
Tezaswi Raja ◽  
...  

Hybrid emulation approach in ISO 26262 compliant unit test process

2019 ◽  
Author(s):  
Narendra Varma Alluri ◽  
Pradeep Reddy Sykam ◽  
Harish Narayanaswamy
Keyword(s):  
Unit Test ◽  
Iso 26262 ◽  
Test Process

GPU-HBM SiP Interconnect Link Test and Repair

2019 ◽  
Author(s):  
Amanulla Khan ◽  
Himakiran Kodihalli ◽  
Thenappan Nachiappan ◽  
Sreekar Sreesailam ◽  
Seth Chou ◽  
...  

Test cost reduction through increase in multi-site testing with reduced scan-out pins

2019 ◽  
Author(s):  
Jaidev Shenoy ◽  
Kelly Ockunzzi ◽  
Kushal Kamal ◽  
Virendra Singh
Keyword(s):  
Cost Reduction ◽  
Site Testing ◽  
Test Cost ◽  
Test Cost Reduction

Improved Diagnosis Methodology for Multi-Defect Scenarios in High Compression Scan based Designs

2019 ◽  
Author(s):  
Bharath Nandakumar ◽  
Anil Malik ◽  
Atul Chhabra ◽  
Sameer Chillarige ◽  
Wilson Pradeep ◽  
...  
Keyword(s):  
High Compression

Debug for root causing SNR degradation due to dither in high performance ADC

2019 ◽  
Author(s):  
Himanshu Varshney ◽  
Nagarajan Vishwanathan ◽  
Rajendrakumar Joish
Keyword(s):  
High Performance

Leveraging IEEE 1850 PSL and Mixed-Signal Assertions for Post-silicon Verification of Automotive Power Devices

2019 ◽  
Author(s):  
Thomas Nirmaier ◽  
Manuel Harrant ◽  
Bjoern Eversmann ◽  
Georg Pelz
Keyword(s):  
Power Devices ◽  
Mixed Signal ◽  
Silicon Verification

High Throughput Chain Diagnosis Methodology with Minimal Failure Data Collection

2019 ◽  
Author(s):  
Sameer Chillarige ◽  
Anil Malik ◽  
Atul Chhabra ◽  
Bharath Nandakumar ◽  
Kanika Kanwal
Keyword(s):  
Data Collection ◽  
High Throughput ◽  
Failure Data
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