Optical Measurement Systems for Industrial Inspection XI
Latest Publications

TOTAL DOCUMENTS

142

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By SPIE

9781510627918, 9781510627925

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Advanced methods for optical nanometrology (Conference Presentation)

Optical Measurement Systems for Industrial Inspection XI ◽

10.1117/12.2531868 ◽

2019 ◽

Author(s):

Bernd Bodermann

Download Full-text

Investigation of non-uniformity of classically polished fused silica surfaces via laser-induced breakdown spectroscopy (Conference Presentation)

Optical Measurement Systems for Industrial Inspection XI ◽

10.1117/12.2537878 ◽

2019 ◽

Author(s):

Christoph Gerhard

Keyword(s):

Fused Silica ◽

Laser Induced Breakdown Spectroscopy ◽

Breakdown Spectroscopy ◽

Silica Surfaces ◽

Laser Induced Breakdown

Download Full-text

Deflectometry (Conference Presentation)

Optical Measurement Systems for Industrial Inspection XI ◽

10.1117/12.2531869 ◽

2019 ◽

Author(s):

Jan Burke

Download Full-text

Approaches for a destructive measurement method of subsurface damages (Conference Presentation)

Optical Measurement Systems for Industrial Inspection XI ◽

10.1117/12.2537877 ◽

2019 ◽

Author(s):

Michael Seiler

Keyword(s):

Measurement Method ◽

Destructive Measurement

Download Full-text

Front Matter: Volume 11056

Optical Measurement Systems for Industrial Inspection XI ◽

10.1117/12.2539839 ◽

2019 ◽

Keyword(s):

Matter Volume

Download Full-text

Roundness measurement by employing laser Doppler distance sensor and error separation techniques (Conference Presentation)

Optical Measurement Systems for Industrial Inspection XI ◽

10.1117/12.2524969 ◽

2019 ◽

Author(s):

Shengyu Shi ◽

Hao Zhang ◽

Jinping Qu ◽

Gang Jin ◽

Robert Kuschmierz ◽

...

Keyword(s):

Laser Doppler ◽

Separation Techniques ◽

Error Separation ◽

Distance Sensor ◽

Roundness Measurement

Download Full-text

Digital holography for quantification of semiconductor structures (Conference Presentation)

Optical Measurement Systems for Industrial Inspection XI ◽

10.1117/12.2525684 ◽

2019 ◽

Author(s):

Vismay Trivedi ◽

Nimit Patel ◽

Mugdha Joglekar ◽

Vani Chhaniwal ◽

Seonoh Lee ◽

...

Keyword(s):

Digital Holography ◽

Semiconductor Structures

Download Full-text

Compact dual-wavelength digital holography using VCSEL technology (Conference Presentation)

Optical Measurement Systems for Industrial Inspection XI ◽

10.1117/12.2526290 ◽

2019 ◽

Author(s):

Daniel Claus ◽

Igor Alekseenko ◽

Raimund Hibst

Keyword(s):

Digital Holography ◽

Dual Wavelength

Download Full-text

Determination of optical fiber layer parameters by inverse evaluation of lateral scattering patterns

Optical Measurement Systems for Industrial Inspection XI ◽

10.1117/12.2524223 ◽

2019 ◽

Author(s):

Gunnar Claussen ◽

Werner Blohm

Keyword(s):

Optical Fiber ◽

Fiber Layer

Download Full-text

Removal of monotonically increasing or decreasing phase ambiguity in retrieved phase by Riesz transform method in digital interferometric techniques

Optical Measurement Systems for Industrial Inspection XI ◽

10.1117/12.2525078 ◽

2019 ◽

Author(s):

Yassine Tounsi ◽

Manoj Kumar ◽

Abdelkrim Nassim ◽

Fernando Mendoza-Santoyo

Keyword(s):

Riesz Transform ◽

Phase Ambiguity ◽

Transform Method

Download Full-text

Optical Measurement Systems for Industrial Inspection XILatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By SPIE

Advanced methods for optical nanometrology (Conference Presentation)

Investigation of non-uniformity of classically polished fused silica surfaces via laser-induced breakdown spectroscopy (Conference Presentation)

Deflectometry (Conference Presentation)

Approaches for a destructive measurement method of subsurface damages (Conference Presentation)

Front Matter: Volume 11056

Roundness measurement by employing laser Doppler distance sensor and error separation techniques (Conference Presentation)

Digital holography for quantification of semiconductor structures (Conference Presentation)

Compact dual-wavelength digital holography using VCSEL technology (Conference Presentation)

Determination of optical fiber layer parameters by inverse evaluation of lateral scattering patterns

Removal of monotonically increasing or decreasing phase ambiguity in retrieved phase by Riesz transform method in digital interferometric techniques

Optical Measurement Systems for Industrial Inspection XI
Latest Publications