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2011 IEEE International Test Conference
Latest Publications
TOTAL DOCUMENTS
76
(FIVE YEARS 0)
H-INDEX
12
(FIVE YEARS 0)
Published By IEEE
9781457701528, 9781457701535, 9781457701511
Latest Documents
Most Cited Documents
Contributed Authors
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Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Analyzing ATE interconnect performance for serial links of 10 Gbps and above
2011 IEEE International Test Conference
◽
10.1109/test.2011.6139158
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2011
◽
Cited By ~ 1
Author(s):
Mitchell Lin
◽
Tyler Tolman
Keyword(s):
Serial Links
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TTTC: Test technology technical council
2011 IEEE International Test Conference
◽
10.1109/test.2011.6139199
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2011
◽
Keyword(s):
Technical Council
◽
Test Technology
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ITC 2011 most significant paper award
2011 IEEE International Test Conference
◽
10.1109/test.2011.6139191
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2011
◽
Keyword(s):
Paper Award
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Optimal manufacturing flow to determine minumum operating voltage
2011 IEEE International Test Conference
◽
10.1109/test.2011.6139169
◽
2011
◽
Cited By ~ 4
Author(s):
Sreejit Chakravarty
◽
Binh Dang
◽
Darcy Escovedo
◽
A. J. Haas
Keyword(s):
Operating Voltage
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Investigation into voltage and process variation-aware manufacturing test
2011 IEEE International Test Conference
◽
10.1109/test.2011.6139138
◽
2011
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Cited By ~ 2
Author(s):
Urban Ingelsson
◽
Bashir M. Al-Hashimi
Keyword(s):
Process Variation
◽
Manufacturing Test
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Title page
2011 IEEE International Test Conference
◽
10.1109/test.2011.6139201
◽
2011
◽
Keyword(s):
Title Page
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Test clock domain optimization for peak power supply noise reduction during scan
2011 IEEE International Test Conference
◽
10.1109/test.2011.6139163
◽
2011
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Cited By ~ 2
Author(s):
Jen-Yang Wen
◽
Yu-Chuan Huang
◽
Min-Hong Tsai
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Kuan-Yu Liao
◽
James C.-M. Li
◽
...
Keyword(s):
Noise Reduction
◽
Power Supply
◽
Peak Power
◽
Power Supply Noise
◽
Domain Optimization
◽
Supply Noise
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Author index
2011 IEEE International Test Conference
◽
10.1109/test.2011.6139182
◽
2011
◽
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A fully cell-based design for timing measurement of memory
2011 IEEE International Test Conference
◽
10.1109/test.2011.6139150
◽
2011
◽
Cited By ~ 5
Author(s):
Yi-Chung Chang
◽
Shi-Yu Huang
◽
Chao-Wen Tzeng
◽
Jack Yao
Keyword(s):
Timing Measurement
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ITC 2010 paper awards
2011 IEEE International Test Conference
◽
10.1109/test.2011.6139184
◽
2011
◽
Download Full-text
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