2017 IEEE North Atlantic Test Workshop (NATW)
Latest Publications

TOTAL DOCUMENTS

9
(FIVE YEARS 0)

H-INDEX

2
(FIVE YEARS 0)

Published By IEEE

9781509059027
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Detecting a trojan die in 3D stacked integrated circuits

2017 ◽  
Author(s):  
Soha Alhelaly ◽  
Jennifer Dworak ◽  
Theodore Manikas ◽  
Ping Gui ◽  
Kundan Nepal ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Stacked Integrated Circuits

An enhanced approach to reduce test application time through limited shift operations in scan chains

2017 ◽  
Author(s):  
Konstantinos Poulos ◽  
Jayasurya Kuchi ◽  
Themistoklis Haniotakis
Keyword(s):  
Application Time ◽  
Test Application Time ◽  
Test Application ◽  
Scan Chains

Mitigating simple power analysis attacks on LSIB key logic

2017 ◽  
Author(s):  
Saurabh Gupta ◽  
Jennifer Dworak ◽  
Daniel Engels ◽  
Al Crouch
Keyword(s):  
Power Analysis ◽  
Power Analysis Attacks ◽  
Simple Power

Peer pressure on identity: On requirements for disambiguating PUFs in noisy environment

2017 ◽  
Author(s):  
Pavithra Ramesh ◽  
Vinay C. Patil ◽  
Sandip Kundu
Keyword(s):  
Peer Pressure ◽  
Noisy Environment

Manufacturer turned attacker: Dangers of stealthy trojans via threshold voltage manipulation

2017 ◽  
Author(s):  
Vinay C. Patil ◽  
Arunkumar Vijayakumar ◽  
Sandip Kundu
Keyword(s):  
Threshold Voltage

[Front cover]

2017 ◽  
Keyword(s):  
Front Cover
Load More ...
Sign in / Sign up

Export Citation Format

Share Document