2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)
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55
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Published By IEEE

9781467363778, 9781467363761
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A software-based self test of CUDA Fermi GPUs

2013 ◽  
Author(s):  
Stefano Di Carlo ◽  
Giulio Gambardella ◽  
Marco Indaco ◽  
Ippazio Martella ◽  
Paolo Prinetto ◽  
...  
Keyword(s):  
Self Test

scholarly journals Novel approach to reduce power droop during scan-based logic BIST

2013 ◽  
Author(s):  
M. Omana ◽  
D. Rossi ◽  
F. Fuzzi ◽  
C. Metra ◽  
C. Tirumurti ◽  
...  
Keyword(s):  
Novel Approach ◽  
Logic Bist

Variability-aware and fault-tolerant self-adaptive applications for many-core chips

2013 ◽  
Author(s):  
Gilles Bizot ◽  
Fabien Chaix ◽  
Nacer-Eddine Zergainoh ◽  
Michael Nicolaidis
Keyword(s):  
Fault Tolerant ◽  
Adaptive Applications ◽  
Many Core ◽  
Self Adaptive

Implementing model redundancy in predictive alternate test to improve test confidence

2013 ◽  
Author(s):  
Haithem Ayari ◽  
Florence Azais ◽  
Serge Bernard ◽  
Mariane Comte ◽  
Vincent Kcrzerho ◽  
...  
Keyword(s):  
Alternate Test ◽  
Model Redundancy

Test generation for circuits with embedded memories using SMT

2013 ◽  
Author(s):  
Sarvesh Prabhu ◽  
Michael S. Hsiao ◽  
Loganathan Lingappan ◽  
Vijay Gangaram
Keyword(s):  
Test Generation ◽  
Embedded Memories
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