2018 IEEE 27th Asian Test Symposium (ATS)
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9781538694664
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect

2018 ◽  
Author(s):  
Jun-Yang Lei ◽  
Thomas Moon ◽  
Justin Chow ◽  
Suresh K. Sitaraman ◽  
Abhijit Chatterjee
Keyword(s):  
Diagnostic System ◽  
Flexible Electronic

A Hybrid DMR Latch to Tolerate MNU Using TDICE and WDICE

2018 ◽  
Author(s):  
Zhengfeng Huang ◽  
Yangyang Zhang ◽  
Zian Su ◽  
Huaguo Liang ◽  
Huijie Yao ◽  
...  

RiskCap: Minimizing Effort of Error Regulation for Approximate Computing

2018 ◽  
Author(s):  
Shuhao Jiang ◽  
Jiajun Li ◽  
Xin He ◽  
Guihai Yan ◽  
Xuan Zhang ◽  
...  
Keyword(s):  
Approximate Computing ◽  
Error Regulation

Dynamic Fine-Grain Power Gating Design in WiNoC

2018 ◽  
Author(s):  
Ouyang Yiming ◽  
Hu Lizhu ◽  
Wu Yifeng ◽  
Yang Jianfeng ◽  
Xing Kun
Keyword(s):  
Power Gating ◽  
Fine Grain
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