2018 IEEE 27th Asian Test Symposium (ATS)
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49
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Published By IEEE

9781538694664
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect

2018 ◽  
Author(s):  
Jun-Yang Lei ◽  
Thomas Moon ◽  
Justin Chow ◽  
Suresh K. Sitaraman ◽  
Abhijit Chatterjee
Keyword(s):  
Diagnostic System ◽  
Flexible Electronic

A Hybrid DMR Latch to Tolerate MNU Using TDICE and WDICE

2018 ◽  
Author(s):  
Zhengfeng Huang ◽  
Yangyang Zhang ◽  
Zian Su ◽  
Huaguo Liang ◽  
Huijie Yao ◽  
...  

RiskCap: Minimizing Effort of Error Regulation for Approximate Computing

2018 ◽  
Author(s):  
Shuhao Jiang ◽  
Jiajun Li ◽  
Xin He ◽  
Guihai Yan ◽  
Xuan Zhang ◽  
...  
Keyword(s):  
Approximate Computing ◽  
Error Regulation

Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST

2018 ◽  
Author(s):  
Senling Wang ◽  
Tomoki Aono ◽  
Yoshinobu Higami ◽  
Hiroshi Takahashi ◽  
Hiroyuki Iwata ◽  
...  
Keyword(s):  
Fault Detection ◽  
Pattern Control ◽  
Logic Bist ◽  
Degradation Problem

Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing

2018 ◽  
Author(s):  
Yucong Zhang ◽  
Xiaoqin Wen ◽  
Stefan Holst ◽  
Kohei Miyase ◽  
Seiji Kajihara ◽  
...  
Keyword(s):  
Low Power ◽  
Clock Skew ◽  
Scan Testing ◽  
Scan Chain

A New Scheme to Extract PUF Information by Scan Chain

2018 ◽  
Author(s):  
Aijiao Cui ◽  
Wei Zhou ◽  
Gang Qu ◽  
Huawei Li
Keyword(s):  
Scan Chain
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