14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Latest Publications

TOTAL DOCUMENTS

100

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Published By IEEE

9781424497553

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Probabilistic equivalence checking based on high-level decision diagrams

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2011.5783130 ◽

2011 ◽

Cited By ~ 2

Author(s):

Anton Karputkin ◽

Raimund Ubar ◽

Mati Tombak ◽

Jaan Raik

Keyword(s):

Equivalence Checking ◽

Decision Diagrams ◽

High Level

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Effective hash-based IPv6 longest prefix match

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2011.5783105 ◽

2011 ◽

Cited By ~ 1

Author(s):

Jiri Tobola ◽

Jan Korenek

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Dual use of power lines for data communications in microprocessors

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2011.5783041 ◽

2011 ◽

Cited By ~ 6

Author(s):

Vipul Chawla ◽

Dong Sam Ha

Keyword(s):

Power Lines ◽

Data Communications ◽

Dual Use

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Decreasing test time by scan chain reorganization

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2011.5783113 ◽

2011 ◽

Author(s):

Pavel Bartos ◽

Zdenek Kotasek ◽

Jan Dohnal

Keyword(s):

Test Time ◽

Scan Chain

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Software defined radio - design and implementation of complete platform

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2011.5783070 ◽

2011 ◽

Cited By ~ 1

Author(s):

P. Pawlowski ◽

A. Dabrowski ◽

P. Skrzypek ◽

P. Roszak ◽

A. Palejko ◽

...

Keyword(s):

Software Defined Radio ◽

Design And Implementation

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Cost-efficient 130nm TSMC Forward Transform and Quantization for H.264/AVC encoders

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2011.5783045 ◽

2011 ◽

Cited By ~ 3

Author(s):

Xuan-Tu Tran ◽

Van-Huan Tran

Keyword(s):

Cost Efficient

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Manufacturing variability analysis in Carbon Nanotube Technology: A comparison with bulk CMOS in 6T SRAM scenario

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2011.5783088 ◽

2011 ◽

Cited By ~ 3

Author(s):

Carmen Garcia ◽

Antonio Rubio

Keyword(s):

Carbon Nanotube ◽

Variability Analysis ◽

Carbon Nanotube Technology

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Low-complexity integrated circuit aging monitor

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2011.5783060 ◽

2011 ◽

Cited By ~ 5

Author(s):

Aleksandar Simevski ◽

Rolf Kraemer ◽

Milos Krstic

Keyword(s):

Integrated Circuit ◽

Low Complexity ◽

Circuit Aging

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Behavior of CMOS polymorphic circuits in high temperature environment

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2011.5783134 ◽

2011 ◽

Cited By ~ 2

Author(s):

Richard Ruzicka ◽

Vaclav Simek ◽

Lukas Sekanina

Keyword(s):

High Temperature ◽

Temperature Environment ◽

High Temperature Environment

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An example of DISPLAY-CTRL IP Component verification in SCE-MI based emulation platform

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2011.5783047 ◽

2011 ◽

Author(s):

Wlodzimierz Wrona ◽

Pawel Duc ◽

Lukasz Barcik ◽

Wojciech Pietrasina

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14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and SystemsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Probabilistic equivalence checking based on high-level decision diagrams

Effective hash-based IPv6 longest prefix match

Dual use of power lines for data communications in microprocessors

Decreasing test time by scan chain reorganization

Software defined radio - design and implementation of complete platform

Cost-efficient 130nm TSMC Forward Transform and Quantization for H.264/AVC encoders

Manufacturing variability analysis in Carbon Nanotube Technology: A comparison with bulk CMOS in 6T SRAM scenario

Low-complexity integrated circuit aging monitor

Behavior of CMOS polymorphic circuits in high temperature environment

An example of DISPLAY-CTRL IP Component verification in SCE-MI based emulation platform

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Latest Publications