Introduction to Analytical Electron Microscopy
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Published By Springer US

9781475755831, 9781475755817

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Elemental Analysis Using Inner-Shell Excitations: A Microanalytical Technique for Materials Characterization

Introduction to Analytical Electron Microscopy ◽

10.1007/978-1-4757-5581-7_9 ◽

1979 ◽

pp. 259-294 ◽

Author(s):

Dennis M. Maher

Keyword(s):

Elemental Analysis ◽

Materials Characterization ◽

Microanalytical Technique

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The Basic Principles of Electron Energy Loss Spectroscopy

Introduction to Analytical Electron Microscopy ◽

10.1007/978-1-4757-5581-7_7 ◽

1979 ◽

pp. 223-244 ◽

Author(s):

David C. Joy

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Basic Principles ◽

Electron Energy Loss

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The Strategy of Analysis

Introduction to Analytical Electron Microscopy ◽

10.1007/978-1-4757-5581-7_22 ◽

1979 ◽

pp. 575-593

Author(s):

Ron Anderson ◽

J. N. Ramsey

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Microanalysis by Lattice Imaging

Introduction to Analytical Electron Microscopy ◽

10.1007/978-1-4757-5581-7_19 ◽

1979 ◽

pp. 507-534 ◽

Author(s):

Robert Sinclair

Keyword(s):

Lattice Imaging

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Convergent Beam Electron Diffraction

Introduction to Analytical Electron Microscopy ◽

10.1007/978-1-4757-5581-7_15 ◽

1979 ◽

pp. 387-422 ◽

Author(s):

J. W. Steeds

Keyword(s):

Electron Diffraction ◽

Convergent Beam Electron Diffraction ◽

Beam Electron ◽

Convergent Beam

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The Analysis of Defects Using Computer Simulated Images

Introduction to Analytical Electron Microscopy ◽

10.1007/978-1-4757-5581-7_21 ◽

1979 ◽

pp. 551-574 ◽

Author(s):

Peter Humble

Keyword(s):

Simulated Images

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Principles of Thin Film X-Ray Microanalysis

Introduction to Analytical Electron Microscopy ◽

10.1007/978-1-4757-5581-7_3 ◽

1979 ◽

pp. 83-120 ◽

Author(s):

J. I. Goldstein

Keyword(s):

Thin Film ◽

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Electron Microscopy of Individual Atoms

Introduction to Analytical Electron Microscopy ◽

10.1007/978-1-4757-5581-7_13 ◽

1979 ◽

pp. 343-368 ◽

Author(s):

M. Isaacson ◽

M. Ohtsuki ◽

M. Utlaut

Keyword(s):

Electron Microscopy

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Barriers to AEM: Contamination and Etching

Introduction to Analytical Electron Microscopy ◽

10.1007/978-1-4757-5581-7_18 ◽

1979 ◽

pp. 481-505 ◽

Author(s):

J. J. Hren

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Quantitative X-Ray Microanalysis: Instrumental Considerations and Applications to Materials Science

Introduction to Analytical Electron Microscopy ◽

10.1007/978-1-4757-5581-7_4 ◽

1979 ◽

pp. 121-167 ◽

Author(s):

Nestor J. Zaluzec

Keyword(s):

Materials Science ◽

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