2015 16th Latin-American Test Symposium (LATS)
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9781467367103
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scholarly journals FPGA redundancy recovery based on partial bitstreams for multiple partitions

2015 ◽  
Author(s):  
Victor M. Goncalves Martins ◽  
Joao Gabriel Reis ◽  
Horacio C. C. Netoy ◽  
Eduardo Augusto Bezerra

Permanent fault detection and diagnosis in the lightweight dual modular redundancy architecture

2015 ◽  
Author(s):  
Ronaldo R. Ferreira ◽  
Ernesto Sanchez ◽  
Jean da Rolt ◽  
Gabrie L. Nazar ◽  
Alvaro F. Moreira ◽  
...  
Keyword(s):  
Fault Detection ◽  
Fault Detection And Diagnosis ◽  
Permanent Fault ◽  
Detection And Diagnosis ◽  
Modular Redundancy

NBTI-induced circuit aging optimization by protectability-aware gate replacement technique

2015 ◽  
Author(s):  
Guimao Zhang ◽  
Maoxiang Yi ◽  
Yong Miao ◽  
Dawen Xu ◽  
Huaguo Liang
Keyword(s):  
Circuit Aging ◽  
Replacement Technique

Design dependent SRAM PUF robustness analysis

2015 ◽  
Author(s):  
Mafalda Cortez ◽  
Said Hamdioui ◽  
Ryoichi Ishihara
Keyword(s):  
Robustness Analysis

Considerations on application of selective hardening based on software fault tolerance techniques

2015 ◽  
Author(s):  
Felipe Restrepo-Calle ◽  
Sergio Cuenca-Asensi ◽  
Antonio Martínez-Alvarez ◽  
Fernanda Lima Kastensmidt
Keyword(s):  
Fault Tolerance ◽  
Software Fault Tolerance ◽  
Software Fault

scholarly journals Design of ultra-low-power smart wearable systems

2015 ◽  
Author(s):  
Gregoire Surrel ◽  
Francisco Rincon ◽  
Srinivasan Murali ◽  
David Atienza
Keyword(s):  
Low Power ◽  
Ultra Low Power ◽  
Wearable Systems ◽  
Smart Wearable

Single event effects in an analog SOI transconductor: a case study

2015 ◽  
Author(s):  
Carlos Viale ◽  
Pablo Petrashin ◽  
Luis Toledo ◽  
Walter Lancioni ◽  
Carlos Vazquez
Keyword(s):  
Single Event ◽  
Single Event Effects

An evolutionary approach for test program compaction

2015 ◽  
Author(s):  
R. Cantoro ◽  
M. Gaudesi ◽  
E. Sanchez ◽  
P. Schiavone ◽  
G. Squillero
Keyword(s):  
Evolutionary Approach ◽  
Test Program
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