Springer Series in Chemical Physics - Laser Processing and Diagnostics
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70

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8

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Published By Springer Berlin Heidelberg

9783642823831, 9783642823817

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Raman-Microsampling Technique Applying Optical Levitation by Radiation Pressure

Springer Series in Chemical Physics - Laser Processing and Diagnostics ◽

10.1007/978-3-642-82381-7_64 ◽

1984 ◽

pp. 491-496

Author(s):

R. Thurn ◽

W. Kiefer

Keyword(s):

Radiation Pressure ◽

Optical Levitation

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Melting Model for UV Lasers

Springer Series in Chemical Physics - Laser Processing and Diagnostics ◽

10.1007/978-3-642-82381-7_6 ◽

1984 ◽

pp. 35-39 ◽

Author(s):

S. Unamuno ◽

M. Toulemonde ◽

P. Siffert

Keyword(s):

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Laser Selective Photoionization Technique: Photoion Beam Epitaxy and Semiconductor Trace Impurity Diagnostics

Springer Series in Chemical Physics - Laser Processing and Diagnostics ◽

10.1007/978-3-642-82381-7_56 ◽

1984 ◽

pp. 437-445

Author(s):

Georgii I. Bekov ◽

Vladilen S. Letokhov ◽

Vyacheslav I. Mishin

Keyword(s):

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Temperature Diagnostics for Laser Writing

Springer Series in Chemical Physics - Laser Processing and Diagnostics ◽

10.1007/978-3-642-82381-7_55 ◽

1984 ◽

pp. 425-436

Author(s):

R. P. Salathé ◽

H. H. Gilgen

Keyword(s):

Laser Writing ◽

Temperature Diagnostics

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Structural Investigation of Laser Processed PZT Ceramics

Springer Series in Chemical Physics - Laser Processing and Diagnostics ◽

10.1007/978-3-642-82381-7_50 ◽

1984 ◽

pp. 375-378 ◽

Author(s):

M. Popescu ◽

I. N. Mihailescu ◽

M. Dinescu ◽

P. Nicolau

Keyword(s):

Structural Investigation ◽

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Time Resolved Calorimetry of 30 nm Te-Films During Laser Annealing

Springer Series in Chemical Physics - Laser Processing and Diagnostics ◽

10.1007/978-3-642-82381-7_4 ◽

1984 ◽

pp. 25-28 ◽

Author(s):

H. Coufal ◽

W. Lee

Keyword(s):

Laser Annealing ◽

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Laser-Assisted Chemical Etching of Inorganic Materials: Mechanistic Studies

Springer Series in Chemical Physics - Laser Processing and Diagnostics ◽

10.1007/978-3-642-82381-7_39 ◽

1984 ◽

pp. 300-314 ◽

Author(s):

T. J. Chuang ◽

Ingo Hussla ◽

W. Sesselmann

Keyword(s):

Chemical Etching ◽

Inorganic Materials ◽

Mechanistic Studies

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Linear-Focused ArF Excimer Laser Beam for Depositing Hydrogenated Silicon Films

Springer Series in Chemical Physics - Laser Processing and Diagnostics ◽

10.1007/978-3-642-82381-7_33 ◽

1984 ◽

pp. 252-256 ◽

Author(s):

M. Murahara ◽

K. Toyoda

Keyword(s):

Excimer Laser ◽

Silicon Films ◽

Hydrogenated Silicon ◽

Arf Excimer Laser

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Instabilities of Crystallization in Amorphous Germanium Under Pulsed Laser Irradiation

Springer Series in Chemical Physics - Laser Processing and Diagnostics ◽

10.1007/978-3-642-82381-7_3 ◽

1984 ◽

pp. 19-24 ◽

Author(s):

P. Fontaine ◽

J. Marfaing ◽

W. Marine ◽

F. Salvan ◽

B. Mutaftschiev

Keyword(s):

Laser Irradiation ◽

Pulsed Laser ◽

Amorphous Germanium ◽

Pulsed Laser Irradiation

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Deposition of Silicon Films by Photodissociation of Silane Under IR Laser Irradiation

Springer Series in Chemical Physics - Laser Processing and Diagnostics ◽

10.1007/978-3-642-82381-7_28 ◽

1984 ◽

pp. 215-220 ◽

Author(s):

Y. Pauleau ◽

D. Tonneau ◽

G. Auvert

Keyword(s):

Laser Irradiation ◽

Silicon Films ◽

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