Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
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Published By Springer New York

9781441978165, 9781441978172

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Overview of Experimental Tools

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces ◽

10.1007/978-1-4419-7817-2_3 ◽

2011 ◽

pp. 23-43

Author(s):

Weronika Walkosz

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Atomic-Resolution Study of β-Si3N4/SiO2 Interfaces

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces ◽

10.1007/978-1-4419-7817-2_6 ◽

2011 ◽

pp. 75-89

Author(s):

Weronika Walkosz

Keyword(s):

Atomic Resolution ◽

Resolution Study

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Structural Energetics of β- $${\bf{{Si}_3{N}_4(10\overline{1}0)}}$$ Surfaces

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces ◽

10.1007/978-1-4419-7817-2_4 ◽

2011 ◽

pp. 45-65

Author(s):

Weronik Walkosz

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Silicon Nitride Ceramics

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces ◽

10.1007/978-1-4419-7817-2_1 ◽

2011 ◽

pp. 1-10

Author(s):

Weronika Walkosz

Keyword(s):

Silicon Nitride ◽

Nitride Ceramics

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Conclusions and Future Work

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces ◽

10.1007/978-1-4419-7817-2_8 ◽

2011 ◽

pp. 97-100

Author(s):

Weronika Walkosz

Keyword(s):

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Atomic-Resolution Study of the Interfacial Bonding at Si3N4/CeO2−δ Grain Boundaries

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces ◽

10.1007/978-1-4419-7817-2_5 ◽

2011 ◽

pp. 67-73

Author(s):

Weronika Walkosz

Keyword(s):

Grain Boundaries ◽

Interfacial Bonding ◽

Atomic Resolution ◽

Resolution Study

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Imaging Bulk α-Si3N4

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces ◽

10.1007/978-1-4419-7817-2_7 ◽

2011 ◽

pp. 91-96

Author(s):

Weronika Walkosz

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Theoretical Methods and Approximations

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces ◽

10.1007/978-1-4419-7817-2_2 ◽

2011 ◽

pp. 11-21

Author(s):

Weronika Walkosz

Keyword(s):

Theoretical Methods

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