2007 ROCS Workshop[Reliability of Compound Semiconductors Digest]
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9780790801155

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Reliability Study of 0.15um MHEMT with Vds≫3V Bias for Amplifier Application

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] ◽

10.1109/rocs.2007.4391061 ◽

2007 ◽

Author(s):

S.C. Chen ◽

H.C. Chou ◽

Frank Chou ◽

Iris Hsieh ◽

D.W. Tu ◽

...

Keyword(s):

Reliability Study

Physical Degradation Characterization of Thin Film Resistors

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] ◽

10.1109/rocs.2007.4391065 ◽

2007 ◽

Cited By ~ 1

Author(s):

William J. Roesch

Keyword(s):

Thin Film ◽

Thin Film Resistors ◽

Physical Degradation

Method for Estimation of the Channel Temperature of GaN High Electron Mobility Transistors

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] ◽

10.1109/rocs.2007.4391064 ◽

2007 ◽

Cited By ~ 5

Author(s):

Jungwoo Joh ◽

Uttiya Chowdhury ◽

Tso-Min Chou ◽

Hua-Quen Tserng ◽

Jose L. Jimenez

Keyword(s):

Electron Mobility ◽

High Electron Mobility Transistors ◽

High Electron ◽

High Electron Mobility ◽

Electron Mobility Transistors ◽

Channel Temperature

Acceleration Factors for THB Induced Degradation of AlGaAs/InGaAs pHEMT Devices

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] ◽

10.1109/rocs.2007.4391058 ◽

2007 ◽

Author(s):

Leslie Marchut ◽

Charles S. Whitman

Intrinsic Reliability of a 12 volt Field Plate pHEMT Measured using Conventional and Step Stress Methods

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] ◽

10.1109/rocs.2007.4391062 ◽

2007 ◽

Author(s):

Craig Gaw ◽

Thomas Arnold ◽

Karen Moore

Keyword(s):

Field Plate

Wafer-level Accelerated Lifetesting of Individual Devices

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] ◽

10.1109/rocs.2007.4391057 ◽

2007 ◽

Cited By ~ 2

Author(s):

Dorothy June M. Hamada ◽

William J. Roesch

Keyword(s):

Wafer Level

Waferside Analysis Technique for GaAs-Based Circuits

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] ◽

10.1109/rocs.2007.4391069 ◽

2007 ◽

Author(s):

Dave Littleton ◽

Dorothy June M. Hamada

Keyword(s):

Analysis Technique

ESD Protection Capabilities of GaAs Schottky Diodes

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] ◽

10.1109/rocs.2007.4391068 ◽

2007 ◽

Cited By ~ 7

Author(s):

Peter Ersland ◽

Shivarajiv Somisetty

Keyword(s):

Schottky Diodes ◽

Esd Protection

Method for Accelerated Determination of GaAs PHEMT Power Slump Reliability

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] ◽

10.1109/rocs.2007.4391056 ◽

2007 ◽

Author(s):

Bob Yeats

Estimating effective dielectric thickness for capacitors with extrinsic defects by a statistical method

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] ◽

10.1109/rocs.2007.4391067 ◽

2007 ◽

Author(s):

Charles S. Whitman

Keyword(s):

Statistical Method ◽

Dielectric Thickness ◽

Extrinsic Defects

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest]Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Reliability Study of 0.15um MHEMT with Vds≫3V Bias for Amplifier Application

Physical Degradation Characterization of Thin Film Resistors

Method for Estimation of the Channel Temperature of GaN High Electron Mobility Transistors

Acceleration Factors for THB Induced Degradation of AlGaAs/InGaAs pHEMT Devices

Intrinsic Reliability of a 12 volt Field Plate pHEMT Measured using Conventional and Step Stress Methods

Wafer-level Accelerated Lifetesting of Individual Devices

Waferside Analysis Technique for GaAs-Based Circuits

ESD Protection Capabilities of GaAs Schottky Diodes

Method for Accelerated Determination of GaAs PHEMT Power Slump Reliability

Estimating effective dielectric thickness for capacitors with extrinsic defects by a statistical method

2007 ROCS Workshop[Reliability of Compound Semiconductors Digest]
Latest Publications