2018 IEEE 23rd European Test Symposium (ETS)
Latest Publications

TOTAL DOCUMENTS

41
(FIVE YEARS 0)

H-INDEX

4
(FIVE YEARS 0)

Published By IEEE

9781538637289
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Online prevention of security violations in reconfigurable scan networks

2018 ◽  
Author(s):  
Ahmed Atteya ◽  
Michael A. Kochte ◽  
Matthias Sauer ◽  
Pascal Raiola ◽  
Bernd Becker ◽  
...  

Towards the formal verification of security properties of a Network-on-Chip router

2018 ◽  
Author(s):  
Johanna Sepulveda ◽  
Damian Aboul-Hassan ◽  
Georg Sigl ◽  
Bernd Becker ◽  
Matthias Sauer
Keyword(s):  
Formal Verification ◽  
Network On Chip ◽  
Security Properties ◽  
On Chip

scholarly journals [Front cover]

2018 ◽  
Keyword(s):  
Front Cover

The impact of production defects on the soft-error tolerance of hardened latches

2018 ◽  
Author(s):  
Stefan Holst ◽  
Ruijun Ma ◽  
Xiaoqing Wen
Keyword(s):  
Soft Error ◽  
Error Tolerance ◽  
The Impact

BISTs for post-bond test and electrical analysis of high density 3D interconnect defects

2018 ◽  
Author(s):  
Imed Jani ◽  
Didier Lattard ◽  
Pascal Vivet ◽  
Lucile Arnaud ◽  
Edith Beigne
Keyword(s):  
High Density ◽  
Electrical Analysis

scholarly journals Automatic generation of in-circuit tests for board assembly defects

2018 ◽  
Author(s):  
Harm van Schaaijk ◽  
Martien Spierings ◽  
Erik Jan Marinissen
Keyword(s):  
Automatic Generation
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