2018 IEEE 23rd European Test Symposium (ETS)
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TOTAL DOCUMENTS

41
(FIVE YEARS 0)

H-INDEX

4
(FIVE YEARS 0)

Published By IEEE

9781538637289
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Online prevention of security violations in reconfigurable scan networks

2018 ◽  
Author(s):  
Ahmed Atteya ◽  
Michael A. Kochte ◽  
Matthias Sauer ◽  
Pascal Raiola ◽  
Bernd Becker ◽  
...  

Towards the formal verification of security properties of a Network-on-Chip router

2018 ◽  
Author(s):  
Johanna Sepulveda ◽  
Damian Aboul-Hassan ◽  
Georg Sigl ◽  
Bernd Becker ◽  
Matthias Sauer
Keyword(s):  
Formal Verification ◽  
Network On Chip ◽  
Security Properties ◽  
On Chip

scholarly journals Automatic generation of in-circuit tests for board assembly defects

2018 ◽  
Author(s):  
Harm van Schaaijk ◽  
Martien Spierings ◽  
Erik Jan Marinissen
Keyword(s):  
Automatic Generation

scholarly journals Recycled IC detection through aging sensor

2018 ◽  
Author(s):  
Daniele Rossi ◽  
Vasileios Tenentes ◽  
Saqib Khursheed ◽  
Sudhakar M. Reddy

Challenges in Cell-Aware Test

2018 ◽  
Author(s):  
Shreyas Pramod Dixit ◽  
Divyeshkumar Dhanjibhai Vora ◽  
Ke Peng

Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262

2018 ◽  
Author(s):  
Senling Wang ◽  
Yoshinobu Higami ◽  
Hiroshi Takahashi ◽  
Hiroyuki Iwata ◽  
Yoichi Maeda ◽  
...  
Keyword(s):  
Fault Detection
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