Testing of Digital Systems
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TOTAL DOCUMENTS

17

(FIVE YEARS 0)

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0

(FIVE YEARS 0)

Published By Cambridge University Press

9780521773560, 9780511816321

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Design for testability

Testing of Digital Systems ◽

10.1017/cbo9780511816321.012 ◽

2003 ◽

pp. 560-679

Keyword(s):

Design For Testability

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Memory testing

Testing of Digital Systems ◽

10.1017/cbo9780511816321.015 ◽

2003 ◽

pp. 845-892

Author(s):

Ad van de Goor

Keyword(s):

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Fault models

Testing of Digital Systems ◽

10.1017/cbo9780511816321.003 ◽

2003 ◽

pp. 26-48

Keyword(s):

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High-level test synthesis

Testing of Digital Systems ◽

10.1017/cbo9780511816321.016 ◽

2003 ◽

pp. 893-952

Keyword(s):

Test Synthesis ◽

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Fault diagnosis

Testing of Digital Systems ◽

10.1017/cbo9780511816321.011 ◽

2003 ◽

pp. 482-559

Keyword(s):

Fault Diagnosis

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Preface

Testing of Digital Systems ◽

10.1017/cbo9780511816321.001 ◽

2003 ◽

pp. xiii-xv

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Delay fault testing

Testing of Digital Systems ◽

10.1017/cbo9780511816321.009 ◽

2003 ◽

pp. 382-444

Keyword(s):

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing

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Test generation for combinational circuits

Testing of Digital Systems ◽

10.1017/cbo9780511816321.005 ◽

2003 ◽

pp. 134-265

Keyword(s):

Test Generation ◽

Combinational Circuits

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System-on-a-chip test synthesis

Testing of Digital Systems ◽

10.1017/cbo9780511816321.017 ◽

2003 ◽

pp. 953-982

Keyword(s):

Test Synthesis ◽

System On A Chip

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Combinational logic and fault simulation

Testing of Digital Systems ◽

10.1017/cbo9780511816321.004 ◽

2003 ◽

pp. 49-133

Keyword(s):

Fault Simulation ◽

Combinational Logic

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