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Modeling Aspects in Optical Metrology VIII
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Published By SPIE
9781510644007, 9781510644014
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Front Matter: Volume 11783
Modeling Aspects in Optical Metrology VIII
◽
10.1117/12.2603205
◽
2021
◽
Keyword(s):
Matter Volume
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Detecting nanoscale perturbations using new forms of optical microscopy
Modeling Aspects in Optical Metrology VIII
◽
10.1117/12.2597062
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2021
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Author(s):
Lynford L. Goddard
Keyword(s):
Optical Microscopy
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Identifying the type of line edge roughness using grazing-incidence x-ray fluorescence
Modeling Aspects in Optical Metrology VIII
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10.1117/12.2592611
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2021
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Author(s):
Zanyar Salami
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Analía Fernández Herrero
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Anna Andrle
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Philipp Hönicke
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Victor Soltwisch
Keyword(s):
Grazing Incidence
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Line Edge Roughness
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X Ray
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Edge Roughness
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Welcome and Introduction to SPIE Conference 11783
Modeling Aspects in Optical Metrology VIII
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10.1117/12.2597015
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2021
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Author(s):
Bernd Bodermann
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Karsten Frenner
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Bryan M. Barnes
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Semi-analytic modeling of diffraction grating BRDF using scalar Fourier optics
Modeling Aspects in Optical Metrology VIII
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10.1117/12.2591771
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2021
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Author(s):
Felix Koch
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Matthias Zilk
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Tilman Glaser
Keyword(s):
Diffraction Grating
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Fourier Optics
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Analytic Modeling
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Modelling of transmission for a stack of two Fizeau wedges with matched parameters
Modeling Aspects in Optical Metrology VIII
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10.1117/12.2592651
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2021
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Author(s):
Elena Stoykova
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Dimana Nazarova
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Marin Nenchev
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Margarita Deneva
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Vectorial 3D modeling of coherence scanning interferometry
Modeling Aspects in Optical Metrology VIII
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10.1117/12.2592617
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2021
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Author(s):
Tobias Pahl
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Sebastian Hagemeier
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Marco Künne
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Corvin Danzglock
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Nils Reinhold
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...
Keyword(s):
3D Modeling
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Heat dynamics in optical ring resonators
Modeling Aspects in Optical Metrology VIII
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10.1117/12.2592552
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2021
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Author(s):
Walter Dickmann
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Lukas Weituschat
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René Eisermann
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Stephan Krenek
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Pablo Aitor Postigo
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...
Keyword(s):
Ring Resonators
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Optical Ring Resonators
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Optical Ring
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Characterization of the optical aberrations of a metrological UV microscope
Modeling Aspects in Optical Metrology VIII
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10.1117/12.2592566
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2021
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Author(s):
Jan Krüger
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Bernd Bodermann
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Rainer Köning
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Wolfgang Haessler-Grohne
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Han Xu
Keyword(s):
Optical Aberrations
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Applicability simulations of inverted plasmonic lenses
Modeling Aspects in Optical Metrology VIII
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10.1117/12.2591098
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2021
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Author(s):
Tim Käseberg
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Thomas Siefke
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Jana Grundmann
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Stefanie Kroker
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Bernd Bodermann
Keyword(s):
Plasmonic Lenses
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