2012 IEEE International Test Conference
Latest Publications

TOTAL DOCUMENTS

83

(FIVE YEARS 0)

H-INDEX

15

(FIVE YEARS 0)

Published By IEEE

9781467315951, 9781467315944, 9781467315937

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Vulnerability-based Interleaving for Multi-Bit Upset (MBU) protection in modern microprocessors

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401594 ◽

2012 ◽

Cited By ~ 3

Author(s):

Michail Maniatakos ◽

Maria K. Michael ◽

Yiorgos Makris

Download Full-text

Adaptive test selection for post-silicon timing validation: A data mining approach

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401540 ◽

2012 ◽

Author(s):

Ming Gao ◽

P. Lisherness ◽

Kwang-Ting Cheng

Keyword(s):

Data Mining ◽

Test Selection ◽

Adaptive Test ◽

Data Mining Approach ◽

Selection For

Download Full-text

The DFT challenges and solutions for the ARM® Cortex™-A15 Microprocessor

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401534 ◽

2012 ◽

Author(s):

Teresa McLaurin ◽

Frank Frederick ◽

Rich Slobodnik

Download Full-text

[Title page]

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401516 ◽

2012 ◽

Keyword(s):

Title Page

Download Full-text

In-system constrained-random stimuli generation for post-silicon validation

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401541 ◽

2012 ◽

Cited By ~ 4

Author(s):

Adam B. Kinsman ◽

Ho Fai Ko ◽

Nicola Nicolici

Download Full-text

Capacitive sensing testability in complex memory devices

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401570 ◽

2012 ◽

Cited By ~ 3

Author(s):

Kenneth P. Parker

Keyword(s):

Memory Devices ◽

Capacitive Sensing

Download Full-text

A memory yield improvement scheme combining built-in self-repair and error correction codes

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401576 ◽

2012 ◽

Cited By ~ 16

Author(s):

Tze-Hsin Wu ◽

Po-Yuan Chen ◽

Mincent Lee ◽

Bin-Yen Lin ◽

Cheng-Wen Wu ◽

...

Keyword(s):

Error Correction ◽

Error Correction Codes ◽

Yield Improvement ◽

Self Repair ◽

Improvement Scheme

Download Full-text

Cell-aware Production test results from a 32-nm notebook processor

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401533 ◽

2012 ◽

Cited By ~ 32

Author(s):

F. Hapke ◽

M. Reese ◽

J. Rivers ◽

A. Over ◽

V. Ravikumar ◽

...

Keyword(s):

Production Test ◽

Test Results

Download Full-text

Keynote address

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401519 ◽

2012 ◽

Cited By ~ 2

Keyword(s):

Keynote Address

Download Full-text

Improved volume diagnosis throughput using dynamic design partitioning

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401564 ◽

2012 ◽

Cited By ~ 22

Author(s):

Xiaoxin Fan ◽

Huaxing Tang ◽

Yu Huang ◽

Wu-Tung Cheng ◽

Sudhakar M. Reddy ◽

...

Keyword(s):

Dynamic Design

Download Full-text