2012 IEEE International Test Conference
Latest Publications

TOTAL DOCUMENTS

83

(FIVE YEARS 0)

H-INDEX

15

(FIVE YEARS 0)

Published By IEEE

9781467315951, 9781467315944, 9781467315937

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

In-system constrained-random stimuli generation for post-silicon validation

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401541 ◽

2012 ◽

Author(s):

Adam B. Kinsman ◽

Ho Fai Ko ◽

Nicola Nicolici

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Capacitive sensing testability in complex memory devices

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401570 ◽

2012 ◽

Author(s):

Kenneth P. Parker

Keyword(s):

Memory Devices ◽

Capacitive Sensing

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[Title page]

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401516 ◽

2012 ◽

Keyword(s):

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Vulnerability-based Interleaving for Multi-Bit Upset (MBU) protection in modern microprocessors

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401594 ◽

2012 ◽

Author(s):

Michail Maniatakos ◽

Maria K. Michael ◽

Yiorgos Makris

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Adaptive test selection for post-silicon timing validation: A data mining approach

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401540 ◽

2012 ◽

Author(s):

Ming Gao ◽

P. Lisherness ◽

Kwang-Ting Cheng

Keyword(s):

Data Mining ◽

Test Selection ◽

Adaptive Test ◽

Data Mining Approach ◽

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The DFT challenges and solutions for the ARM® Cortex™-A15 Microprocessor

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401534 ◽

2012 ◽

Author(s):

Teresa McLaurin ◽

Frank Frederick ◽

Rich Slobodnik

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Improved volume diagnosis throughput using dynamic design partitioning

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401564 ◽

2012 ◽

Author(s):

Xiaoxin Fan ◽

Huaxing Tang ◽

Yu Huang ◽

Wu-Tung Cheng ◽

Sudhakar M. Reddy ◽

...

Keyword(s):

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Integrated optimization of semiconductor manufacturing: A machine learning approach

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401531 ◽

2012 ◽

Author(s):

Nathan Kupp ◽

Yiorgos Makris

Keyword(s):

Machine Learning ◽

Semiconductor Manufacturing ◽

Learning Approach ◽

Integrated Optimization ◽

Machine Learning Approach

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Real-time testing method for 16 Gbps 4-PAM signal interface

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401524 ◽

2012 ◽

Author(s):

Masahiro Ishida ◽

Kiyotaka Ichiyama ◽

Daisuke Watanabe ◽

Masayuki Kawabata ◽

Toshiyuki Okayasu

Keyword(s):

Real Time ◽

Testing Method ◽

Signal Interface

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Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsampling

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401591 ◽

2012 ◽

Author(s):

Thomas Moon ◽

Hyun Woo Choi ◽

Abhijit Chatterjee

Keyword(s):

Data Acquisition ◽

Test Data ◽

Low Cost ◽

Signal Reconstruction ◽

Period Estimation

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