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2013 IEEE Conference on Reliability Science for Advanced Materials and Devices
Latest Publications
TOTAL DOCUMENTS
5
(FIVE YEARS 0)
H-INDEX
1
(FIVE YEARS 0)
Published By IEEE
9781467320207
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Latest Documents
Most Cited Documents
Contributed Authors
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Electrical conduction effect on reliability of low-k dielectric in Cu interconnect
2013 IEEE Conference on Reliability Science for Advanced Materials and Devices
◽
10.1109/rsamd.2013.6647896
◽
2013
◽
Author(s):
Mingte Lin
◽
Alex Juan
◽
K. C. Su
Keyword(s):
Electrical Conduction
◽
Cu Interconnect
◽
Low K
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Advanced X-ray diffraction metrology as a means of improving semiconductor device reliability
2013 IEEE Conference on Reliability Science for Advanced Materials and Devices
◽
10.1109/rsamd.2013.6647895
◽
2013
◽
Author(s):
Bruce Gittleman
Keyword(s):
Semiconductor Device
◽
X Ray Diffraction
◽
X Ray
◽
Device Reliability
◽
Semiconductor Device Reliability
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A toolbox approach to reliably integrating MEMS gyroscopes into harsh acoustic and vibration environments
2013 IEEE Conference on Reliability Science for Advanced Materials and Devices
◽
10.1109/rsamd.2013.6647894
◽
2013
◽
Cited By ~ 1
Author(s):
Robert N. Dean
◽
George T. Flowers
Keyword(s):
Mems Gyroscopes
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Reliability challenges of FinFET and other multi-gate MOSFETs
2013 IEEE Conference on Reliability Science for Advanced Materials and Devices
◽
10.1109/rsamd.2013.6647897
◽
2013
◽
Cited By ~ 1
Author(s):
Javaneh Mohseni
◽
James D. Meindl
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The effect of etch residuals on via reliability
2013 IEEE Conference on Reliability Science for Advanced Materials and Devices
◽
10.1109/rsamd.2013.6647898
◽
2013
◽
Author(s):
Shawn A. Adderly
◽
Matthew D. Moon
◽
Max L. Lifson
◽
Nathaniel W. Bowe
◽
Jeffrey P. Gambino
◽
...
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