2021 China Semiconductor Technology International Conference (CSTIC)
Latest Publications

TOTAL DOCUMENTS

172
(FIVE YEARS 172)

H-INDEX

0
(FIVE YEARS 0)

Published By IEEE

9781665449458
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Wi-Fi 6E Test Challenges on ATE

2021 ◽  
Author(s):  
Ping Wang ◽  
Mason Zhang ◽  
Zhiqiang Bai ◽  
Haixia Guo ◽  
Eng-Keong Tan

High-K Bubble Defect Researches in Stack-BSI Process Product

2021 ◽  
Author(s):  
Zhuo Yin ◽  
Jianjun Li ◽  
Xiaoping Li ◽  
Na Zhu ◽  
Lifeng Liu ◽  
...  
Keyword(s):  
High K ◽  
Process Product

Peeling Defect Studying with N2/H2 Plasma during Carbon-based Recess Etch

2021 ◽  
Author(s):  
Jinrong Wu ◽  
Junwen Huang ◽  
Taojun Zhuang ◽  
Weijun Luo ◽  
Victor Fang ◽  
...  
Keyword(s):  
Carbon Based
Load More ...
Sign in / Sign up

Export Citation Format

Share Document