Proceedings., International Test Conference
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TOTAL DOCUMENTS

129

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22

(FIVE YEARS 0)

Published By Int. Test Conference

0780321022

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Testing CMOS logic gates for: realistic shorts

Proceedings., International Test Conference ◽

10.1109/test.1994.527981 ◽

2002 ◽

Cited By ~ 31

Author(s):

B. Chess ◽

A. Freitas ◽

F.J. Ferguson ◽

T. Larrabee

Keyword(s):

Logic Gates

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MCM test trade-offs

Proceedings., International Test Conference ◽

10.1109/test.1994.527977 ◽

2002 ◽

Author(s):

J. Eastman

Keyword(s):

Trade Offs

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System test cost modelling based on event rate analysis

Proceedings., International Test Conference ◽

10.1109/test.1994.527939 ◽

2002 ◽

Cited By ~ 10

Author(s):

D. Farren ◽

A.P. Ambler

Keyword(s):

Event Rate ◽

Test Cost ◽

Rate Analysis ◽

Cost Modelling

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Design of an efficient weighted random pattern generation system

Proceedings., International Test Conference ◽

10.1109/test.1994.527991 ◽

2002 ◽

Cited By ~ 42

Author(s):

R. Kapur ◽

S. Patil ◽

T.J. Snethen ◽

T.W. Williams

Keyword(s):

Pattern Generation ◽

Random Pattern ◽

Generation System

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Testing two generations of HDTV decoders-the impact of boundary scan test

Proceedings., International Test Conference ◽

10.1109/test.1994.528040 ◽

2002 ◽

Cited By ~ 1

Author(s):

L. Eerenstein

Keyword(s):

Boundary Scan ◽

Scan Test ◽

Two Generations ◽

Boundary Scan Test ◽

The Impact

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An effective BIST scheme for ring-address type FIFOs

Proceedings., International Test Conference ◽

10.1109/test.1994.527979 ◽

2002 ◽

Cited By ~ 20

Author(s):

Y. Zorian ◽

A.J. Van de Goor ◽

I. Schanstra

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Structure and metrology for a single-wire analog testability bus

Proceedings., International Test Conference ◽

10.1109/test.1994.528041 ◽

2002 ◽

Cited By ~ 6

Author(s):

Yunsheng Lu ◽

Weiwei Mao ◽

R. Dandapani ◽

R.K. Gulati

Keyword(s):

Single Wire

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ECC-on-SIMM test challenges

Proceedings., International Test Conference ◽

10.1109/test.1994.527993 ◽

2002 ◽

Cited By ~ 1

Author(s):

T.J. Dell

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B-algorithm: a behavioral test generation algorithm

Proceedings., International Test Conference ◽

10.1109/test.1994.528046 ◽

2002 ◽

Cited By ~ 1

Author(s):

Chang Hyun Cho ◽

J.R. Armstrong

Keyword(s):

Test Generation ◽

Behavioral Test ◽

Generation Algorithm

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A test methodology to support an ASEM MCM foundry

Proceedings., International Test Conference ◽

10.1109/test.1994.527984 ◽

2002 ◽

Cited By ~ 3

Author(s):

T. Storey ◽

C. Lapihuska ◽

E. Atwood ◽

L. Su

Keyword(s):

Test Methodology

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