2020 IEEE International Test Conference in Asia (ITC-Asia)
Latest Publications

TOTAL DOCUMENTS

38

(FIVE YEARS 38)

H-INDEX

0

(FIVE YEARS 0)

Published By IEEE

9781728189444

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

ITC-Asia 2020 Opinion

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00005 ◽

2020 ◽

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High Efficiency and Low Overkill Testing for Probabilistic Circuits

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00026 ◽

2020 ◽

Author(s):

Ming-Ting Lee ◽

Chen-Hung Wu ◽

Shi-Tang Liu ◽

Cheng-Yun Hsieh ◽

James Chien-Mo Li

Keyword(s):

High Efficiency ◽

Probabilistic Circuits

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Path Delay Measurement with Correction for Temperature And Voltage Variations

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00031 ◽

2020 ◽

Author(s):

Yousuke Miyake ◽

Takaaki Kato ◽

Seiji Kajihara

Keyword(s):

Delay Measurement

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ITC-Asia 2020 Commentary

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00001 ◽

2020 ◽

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ITC-Asia 2020 Index

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00038 ◽

2020 ◽

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W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00028 ◽

2020 ◽

Author(s):

Hayoung Lee ◽

Donghyun Han ◽

Hogyeong Kim ◽

Sungho Kang

Keyword(s):

Cost Reduction ◽

Wafer Level ◽

Early Repair ◽

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A Self-Detection and Self-Repair Methodology for Reliable Speech Recognition Considering AWGN Noises

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00036 ◽

2020 ◽

Author(s):

Tong-Yu Hsieh ◽

Yu-Min Chung

Keyword(s):

Speech Recognition ◽

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On Enhancing Error-Tolerability of Videos via Re-Encoding with Adaptive I-Frame Insertion

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00035 ◽

2020 ◽

Author(s):

Tong-Yu Hsieh ◽

Chen-Chia Chung ◽

Jun-Tsung Wu

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[Copyright notice]

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00003 ◽

2020 ◽

Keyword(s):

Copyright Notice

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Refresh Power Reduction of DRAMs in DNN Systems Using Hybrid Voting and ECC Method

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00019 ◽

2020 ◽

Author(s):

Tsung-Fu Hsieh ◽

Jin-Fu Li ◽

Jenn-Shiang Lai ◽

Chih-Yen Lo ◽

Ding-Ming Kwai ◽

...

Keyword(s):

Power Reduction

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