2020 IEEE International Test Conference in Asia (ITC-Asia)
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 38)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781728189444

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

ITC-Asia 2020 Index

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00038 ◽

2020 ◽

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ITC-Asia 2020 Opinion

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00005 ◽

2020 ◽

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High Efficiency and Low Overkill Testing for Probabilistic Circuits

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00026 ◽

2020 ◽

Author(s):

Ming-Ting Lee ◽

Chen-Hung Wu ◽

Shi-Tang Liu ◽

Cheng-Yun Hsieh ◽

James Chien-Mo Li

Keyword(s):

High Efficiency ◽

Probabilistic Circuits

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Path Delay Measurement with Correction for Temperature And Voltage Variations

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00031 ◽

2020 ◽

Author(s):

Yousuke Miyake ◽

Takaaki Kato ◽

Seiji Kajihara

Keyword(s):

Path Delay ◽

Delay Measurement

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W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00028 ◽

2020 ◽

Author(s):

Hayoung Lee ◽

Donghyun Han ◽

Hogyeong Kim ◽

Sungho Kang

Keyword(s):

Cost Reduction ◽

Wafer Level ◽

Early Repair ◽

Memory Repair

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A Self-Detection and Self-Repair Methodology for Reliable Speech Recognition Considering AWGN Noises

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00036 ◽

2020 ◽

Author(s):

Tong-Yu Hsieh ◽

Yu-Min Chung

Keyword(s):

Speech Recognition ◽

Self Repair

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On Enhancing Error-Tolerability of Videos via Re-Encoding with Adaptive I-Frame Insertion

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00035 ◽

2020 ◽

Author(s):

Tong-Yu Hsieh ◽

Chen-Chia Chung ◽

Jun-Tsung Wu

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[Copyright notice]

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00003 ◽

2020 ◽

Keyword(s):

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Refresh Power Reduction of DRAMs in DNN Systems Using Hybrid Voting and ECC Method

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00019 ◽

2020 ◽

Author(s):

Tsung-Fu Hsieh ◽

Jin-Fu Li ◽

Jenn-Shiang Lai ◽

Chih-Yen Lo ◽

Ding-Ming Kwai ◽

...

Keyword(s):

Power Reduction

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Adaptive Test Pattern Reordering for Diagnosis using k-Nearest Neighbors

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00022 ◽

2020 ◽

Author(s):

Chenlei Fang ◽

Qicheng Huang ◽

R.D. Blanton

Keyword(s):

Test Pattern ◽

Nearest Neighbors ◽

K Nearest Neighbors ◽

Adaptive Test

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2020 IEEE International Test Conference in Asia (ITC-Asia)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

ITC-Asia 2020 Index

ITC-Asia 2020 Opinion

High Efficiency and Low Overkill Testing for Probabilistic Circuits

Path Delay Measurement with Correction for Temperature And Voltage Variations

W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction

A Self-Detection and Self-Repair Methodology for Reliable Speech Recognition Considering AWGN Noises

On Enhancing Error-Tolerability of Videos via Re-Encoding with Adaptive I-Frame Insertion

[Copyright notice]

Refresh Power Reduction of DRAMs in DNN Systems Using Hybrid Voting and ECC Method

Adaptive Test Pattern Reordering for Diagnosis using k-Nearest Neighbors

2020 IEEE International Test Conference in Asia (ITC-Asia)
Latest Publications