26th IEEE VLSI Test Symposium (vts 2008)
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0769531237, 9780769531236
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise

2008 ◽  
Author(s):  
Rajarajan Senguttuvan ◽  
Soumendu Bhattacharya ◽  
Abhijit Chatterjee

An Industrial Case Study of Sticky Path-Delay Faults

2008 ◽  
Author(s):  
I-De Huang ◽  
Yi-Shing Chang ◽  
Sandeep K. Gupta ◽  
Sreejit Chakravarty
Keyword(s):  
Delay Faults ◽  
Path Delay ◽  
Path Delay Faults ◽  
Industrial Case Study

Signature Rollback - A Technique for Testing Robust Circuits

2008 ◽  
Author(s):  
Uranmandakh Amgalan ◽  
Christian Hachmann ◽  
Sybille Hellebrand ◽  
Hans-Joachim Wunderlich

An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing

2008 ◽  
Author(s):  
A. Ney ◽  
P. Girard ◽  
S. Pravossoudovitch ◽  
A. Virazel ◽  
M. Bastian ◽  
...  
Keyword(s):  
Voltage Sensing ◽  
Sram Design
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