2005 ◽  
Vol 71 (17) ◽  
Author(s):  
E. Šimánek ◽  
A. Rebei
Keyword(s):  

1969 ◽  
Vol 19 (10) ◽  
pp. 1204-1213 ◽  
Author(s):  
F. Kroupa ◽  
I. Vagera

1997 ◽  
Vol 30 (5) ◽  
pp. 849-853 ◽  
Author(s):  
W. Treimer ◽  
A. Höfer ◽  
H. Strothmann

The investigations of the domain structure in Ni single crystals is best performed with a double-crystal diffractometer. Conventional small-angle instruments do not have the necessary angular resolution to distinguish satellites of a main peak due to spin-dependent refraction of unpolarized neutrons by Bloch walls in Ni. With the help of a double-crystal diffractometer operating with lamellae crystals as monochromator and analyzer, the angular resolution is maintained but the intensity enhanced by a factor of 5.4. Within a series of measurements, it was possible to investigate Ni domains due to the high angular resolution of the new multi-double-crystal instrument and this improved intensity. The first results of the domain structure in (110) Ni single crystals and a good estimation of the Bloch wall thickness are given.


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