The observation of small magnetic materials is one of the most important applications of electron holography to material science, because interferometry by means of electron holography can directly visualize magnetic flux lines in a very small area. To observe magnetic structures by transmission electron microscopy it is important to control the magnetic field applied to the specimen in order to prevent it from changing its magnetic state. The easiest method is tuming off the objective lens current and focusing with the first intermediate lens. The other method is using a low magnetic-field lens, where the specimen is set above the lens gap.Figure 1 shows an interference micrograph of an isolated particle of barium ferrite on a thin carbon film observed from approximately [111]. A hologram of this particle was recorded by the transmission electron microscope, Hitachi HF-2000, equipped with an electron biprism. The phase distribution of the object electron wave was reconstructed digitally by the Fourier transform method and converted to the interference micrograph Fig 1.
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