Lorentz Scanning Electron/Ion Microscopy

We have developed an observation and measurement method for spatial electromagnetic fields by using scanning electron/ion microscopes, combined with electron holography reconstruction technique. A cross-grating was installed below the specimen, and the specimens were observed under the infocus condition, and the grating was simultaneously observed under the defocus condition. Electromagnetic fields around the specimen were estimated from grating-image distortions. This method is effective for low and middle magnification and resolution ranges; furthermore, this method can in principle be realizable in any electron/ion beam instruments because it is based on the Lorentz force model for charged particle beams. Mini Abstract We have developed a visualization technique for spatial electromagnetic fields by using scanning electron/ion microscopes, combined with electron holography reconstruction technique. A specimen and a cross-grating installed below the specimen were observed simultaneously. The distorted grating image caused by electromagnetic fields around the specimen were quantitatively measured and visualized.

Electron Microscopy Imaging of Flux Pinning Defects in YBCO Superconductors

<p>High-temperature superconductors are of great interest because they can transport electrical current without loss. For real-world applications, the amount of current, known as the critical current Ic, that can be carried by superconducting wires is the key figure of merit. Large Ic values are necessary to off-set the higher cost of these wires. The factors that improve Ic (microstructure/performance relationship) in the state-of-the-art coated conductor wires based on YBa₂Cu₃O₇ (YBCO) are not fully understood. However, microstructural defects that immobilise (or pin) tubes of magnetic flux (known as vortices) inside the coated conductors are known to play a role in improving Ic. In this thesis, the vortex-defect interaction in YBCO superconductors was investigated with high-end transmission electron microscopy (TEM) techniques using two approaches. First, the effect of dysprosium (Dy) addition and oxygenation temperature on the microstructure and critical current were investigated in detail. Changing only the oxygenation temperature leads to many microstructural changes in pure YBCO coated conductors. It was found that Dy addition reduces the sensitivity of the YBCO to the oxygenation temperature, in particular it lowers the microstructural disorder while maintaining the formation of nanoparticles, which both contribute to the enhancement of Ic. In the second approach, two TEM based techniques (off-axis electron holography and Lorentz microscopy) were used to study the magnetic flux vortices. Vortex imaging was attempted with a TEM operated at 300 kV on both a YBCO crystal as well as a YBCO coated conductor. Many challenges were encountered including sample preparation, inhomogeneity, and geometry, in addition to the need to perform measurements at cryogenic temperatures. Although vortices were not able to be observed in the coated conductors, tentative observation of vortices in a YBCO crystal was made using Lorentz microscopy. Improvements for future electron holography experiments on YBCO at low voltage are suggested. This work represents a pioneering step towards directly imaging vortices in YBCO using more widely available microscopes with the aim of better understanding flux pinning to ultimately boost Ic in superconducting wires.</p>

Electron Microscopy Imaging of Flux Pinning Defects in YBCO Superconductors

<p>High-temperature superconductors are of great interest because they can transport electrical current without loss. For real-world applications, the amount of current, known as the critical current Ic, that can be carried by superconducting wires is the key figure of merit. Large Ic values are necessary to off-set the higher cost of these wires. The factors that improve Ic (microstructure/performance relationship) in the state-of-the-art coated conductor wires based on YBa₂Cu₃O₇ (YBCO) are not fully understood. However, microstructural defects that immobilise (or pin) tubes of magnetic flux (known as vortices) inside the coated conductors are known to play a role in improving Ic. In this thesis, the vortex-defect interaction in YBCO superconductors was investigated with high-end transmission electron microscopy (TEM) techniques using two approaches. First, the effect of dysprosium (Dy) addition and oxygenation temperature on the microstructure and critical current were investigated in detail. Changing only the oxygenation temperature leads to many microstructural changes in pure YBCO coated conductors. It was found that Dy addition reduces the sensitivity of the YBCO to the oxygenation temperature, in particular it lowers the microstructural disorder while maintaining the formation of nanoparticles, which both contribute to the enhancement of Ic. In the second approach, two TEM based techniques (off-axis electron holography and Lorentz microscopy) were used to study the magnetic flux vortices. Vortex imaging was attempted with a TEM operated at 300 kV on both a YBCO crystal as well as a YBCO coated conductor. Many challenges were encountered including sample preparation, inhomogeneity, and geometry, in addition to the need to perform measurements at cryogenic temperatures. Although vortices were not able to be observed in the coated conductors, tentative observation of vortices in a YBCO crystal was made using Lorentz microscopy. Improvements for future electron holography experiments on YBCO at low voltage are suggested. This work represents a pioneering step towards directly imaging vortices in YBCO using more widely available microscopes with the aim of better understanding flux pinning to ultimately boost Ic in superconducting wires.</p>

In-Situ Electrical Biasing of Electrically Connected TEM Lamellae with Embedded Nanodevices

In response to a continually rising demand for high performance and low-cost devices, and equally driven by competitivity, the microelectronics industry excels in meeting innovation challenges and further miniaturizing products. However, device shrinkage and the increasing complexity of device architecture require local quantitative studies. In this paper, we demonstrate with a case study on a nanocapacitor, the capability of transmission electron microscopy in electron holography mode to be a unique in-situ technique for mapping electric fields and charge distributions on a single device.