First‐Principles Investigation of the Effect of Vanadium Doping on Hydrogen Incorporation in Tungsten

2021 ◽  
pp. 2100115
Author(s):  
Zilin Cui ◽  
Xin Zhang ◽  
Yuhong Xu ◽  
Guangjiu Lei ◽  
Heng Li ◽  
...  
2019 ◽  
Vol 34 (01) ◽  
pp. 2050014
Author(s):  
Yingying Li ◽  
Xuxin Yang ◽  
Zihao Wang ◽  
Yonghong Hu ◽  
Caixia Mao ◽  
...  

The geometric structure, energy barrier and electronic properties of H-incorporated [Formula: see text] heterojunctions were investigated by first-principles calculations. Hydrogen atom settles in [Formula: see text] as interstitial impurity due to its small radius. Through calculating and analyzing the total energies of H-incorporated [Formula: see text] heterojunction, a much higher potential barrier (1.75 eV) was found when H atom diffuses from the interface into the [Formula: see text] material than that (0.25 eV) into the Zr metal. The encountered potential barriers of H atom diffusing from vacuum into the [Formula: see text] and Zr metal are also calculated, and they are both positive. These findings indicate that [Formula: see text] is a suitable coating material to prevent the hydrogen embrittlement and corrosion in Zr metal. The electronic properties and valence bond properties of H-incorporated [Formula: see text] were analyzed based on the band structure, electronic density of states and Mulliken distribution. The calculated results show that all the H-incorporated [Formula: see text] heterojunctions exhibit metallic, covalent and ionic properties. These investigations may provide new insight into the underlying mechanisms of hydrogen diffusion in the [Formula: see text] heterojunction.


2010 ◽  
Vol 150 (15-16) ◽  
pp. 701-706 ◽  
Author(s):  
K.H. He ◽  
G. Zheng ◽  
B. Kirtman ◽  
Q.L. Chen ◽  
X.C. Wang ◽  
...  

2016 ◽  
Vol 41 (15) ◽  
pp. 6387-6393 ◽  
Author(s):  
Haimin Ding ◽  
Nicolas Glandut ◽  
Xiaoliang Fan ◽  
Qing Liu ◽  
Yu Shi ◽  
...  

2016 ◽  
Vol 90 (3) ◽  
pp. 939-945 ◽  
Author(s):  
ZHANG Xiaoling ◽  
FAN Xiaoyu ◽  
MENG Dawei ◽  
WU Xiuling ◽  
LIU Weiping

1998 ◽  
Vol 93 (6) ◽  
pp. 947-954 ◽  
Author(s):  
C.J. ADAM ◽  
S.J. CLARK ◽  
M.R. WILSON ◽  
G.J. ACKLAND ◽  
J. CRAIN

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