More powerful panel data unit root tests with an application to mean reversion in real exchange rates

2004 ◽  
Vol 19 (2) ◽  
pp. 147-170 ◽  
Author(s):  
L. Vanessa Smith ◽  
Stephen Leybourne ◽  
Tae-Hwan Kim ◽  
Paul Newbold
2000 ◽  
Vol 136 (3) ◽  
pp. 478-490 ◽  
Author(s):  
Ashok Parikh ◽  
Elizabeth Wakerly

Sign in / Sign up

Export Citation Format

Share Document