Elimination of the dependency of the calibration plane and the sample thickness from complex permittivity measurements of thin materials

2009 ◽  
Vol 51 (7) ◽  
pp. 1642-1646 ◽  
Author(s):  
U. C. Hasar ◽  
O. E. Inan
Author(s):  
Martin S. Hilario ◽  
Brad W. Hoff ◽  
Benmaan Jawdat ◽  
Michael T. Lanagan ◽  
Zane W. Cohick ◽  
...  

2000 ◽  
Vol 48 (11) ◽  
pp. 2159-2164 ◽  
Author(s):  
A.S. Omar ◽  
A.B. Maslenikov ◽  
V.G. Belenky ◽  
S.G. Ogourtsov ◽  
K.B. Yu

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