Anomalous Transmission of X-Rays for Divergent Incident Beam

1970 ◽  
Vol 38 (2) ◽  
pp. 531-540 ◽  
Author(s):  
E. K. Kovev ◽  
L. I. Korovin ◽  
O. N. Efimov
1986 ◽  
Vol 55 (12) ◽  
pp. 4172-4174 ◽  
Author(s):  
Yasuji Kashiwase ◽  
Masahiro Mori ◽  
Motokazu Kogiso ◽  
Masayuki Minoura ◽  
Satoshi Sasaki ◽  
...  

1998 ◽  
Vol 47 (11) ◽  
pp. 1818
Author(s):  
XU ZHANG-CHENG ◽  
GUO CHANG-LIN ◽  
ZHAO ZONG-YAN ◽  
T.FUKAMACHI ◽  
R.NEGISHI

2016 ◽  
Vol 23 (4) ◽  
pp. 880-886 ◽  
Author(s):  
Jungho Kim ◽  
Xianbo Shi ◽  
Diego Casa ◽  
Jun Qian ◽  
XianRong Huang ◽  
...  

Advances in resonant inelastic X-ray scattering (RIXS) have come in lockstep with improvements in energy resolution. Currently, the best energy resolution at the IrL3-edge stands at ∼25 meV, which is achieved using a diced Si(844) spherical crystal analyzer. However, spherical analyzers are limited by their intrinsic reflection width. A novel analyzer system using multiple flat crystals provides a promising way to overcome this limitation. For the present design, an energy resolution at or below 10 meV was selected. Recognizing that the angular acceptance of flat crystals is severely limited, a collimating element is essential to achieve the necessary solid-angle acceptance. For this purpose, a laterally graded, parabolic, multilayer Montel mirror was designed for use at the IrL3-absorption edge. It provides an acceptance larger than 10 mrad, collimating the reflected X-ray beam to smaller than 100 µrad, in both vertical and horizontal directions. The performance of this mirror was studied at beamline 27-ID at the Advanced Photon Source. X-rays from a diamond (111) monochromator illuminated a scattering source of diameter 5 µm, generating an incident beam on the mirror with a well determined divergence of 40 mrad. A flat Si(111) crystal after the mirror served as the divergence analyzer. From X-ray measurements, ray-tracing simulations and optical metrology results, it was established that the Montel mirror satisfied the specifications of angular acceptance and collimation quality necessary for a high-resolution RIXS multi-crystal analyzer system.


1989 ◽  
Vol 62 (8) ◽  
pp. 925-928 ◽  
Author(s):  
Yasuji Kashiwase ◽  
Masahiro Mori ◽  
Motokazu Kogiso ◽  
Katsutoshi Ushida ◽  
Masayuki Minoura ◽  
...  

1991 ◽  
Vol 35 (B) ◽  
pp. 995-1000
Author(s):  
J.V. Gilfrich ◽  
E.F. Skelton ◽  
S.B. Qadri ◽  
N.E. Moulton ◽  
D.J. Nagel ◽  
...  

AbstractIt has been well established over recent years that synchrotron radiation possesses some unique features as a source of primary x-rays for x-ray fluorescence analysis. Advantage has been taken of the high intensity emanating from the bending magnets of storage rings to develop x-ray microprobes utilizing apertures or focussing optics, or both, to provide a beam spot at the specimen of the order of micrometers. The use of insertion devices wigglers and undulatora, can further increase the available intensity, especially for the high energy photons. Beam Line X-17C at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory, accepts the unmodified continuum radiation from a superconducting wiggler in the storage ring. Some initial XRF measurements have been made on this beam line using apertures in the 10 to 100 micrometer range. The fluorescent radiation was measured by an intrinsic Ge detector having an energy resolution of 300 eV at 15 kev, and located at 90° to the incident beam in the plane of the electron orbit. In samples containing many elements, detection limits of a few ppm were achieved with 100 μm beams.


1982 ◽  
Vol 51 (8) ◽  
pp. 2379-2380 ◽  
Author(s):  
Yasuji Kashiwase ◽  
Yoshiro Kainuma

1963 ◽  
Vol 34 (9) ◽  
pp. 2716-2721 ◽  
Author(s):  
J. R. Patel ◽  
B. W. Batterman

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