scholarly journals The Origin and Formation Mechanism of an Inclined Line‐like Defect in 4H‐SiC Epilayers

Author(s):  
Robin Karhu ◽  
Misagh Ghezellou ◽  
Jawad Ul Hassan
Keyword(s):  
2018 ◽  
Author(s):  
Naoto Haruki ◽  
Akihiko Horibe ◽  
Yutaka Yamada ◽  
Touru Kawaguchi

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