Depth profile characterization of spin-coated poly(3,4-ethylenedioxythiophene): poly(styrene sulfonic acid) (PEDOT:PSS) films by spectroscopic ellipsometry

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pp. 3025-3028 ◽  
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Polymer Korea ◽  
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Sung A Kang ◽  
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2014 ◽  
Vol 129 ◽  
pp. 120-126 ◽  
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