Depth Profile Characterization of Spin-Coated Poly(3,4-ethylenedioxythiophene):Poly(styrene sulfonic acid) Films for Thin-Film Solar Cells during Argon Plasma Etching by Spectroscopic Ellipsometry
2011 ◽
Vol 50
(8S1)
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pp. 08JG02
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Keyword(s):
Keyword(s):
2011 ◽
Vol 50
(8)
◽
pp. 08JG02
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Keyword(s):
2011 ◽
Vol 11
(9)
◽
pp. 8035-8039
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Keyword(s):
2011 ◽
Vol 8
(10)
◽
pp. 3025-3028
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Keyword(s):
2002 ◽
Vol 149
(2)
◽
pp. G147
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