Improvements in quantification accuracy of inorganic time-of-flight secondary ion mass spectrometric analysis of silicate materials by using C60primary ions

2009 ◽  
Vol 23 (21) ◽  
pp. 3355-3360 ◽  
Author(s):  
Torsten Henkel ◽  
Detlef Rost ◽  
Ian C. Lyon
1993 ◽  
Vol 20 (12) ◽  
pp. 991-999 ◽  
Author(s):  
R. W. Linton ◽  
M. P. Mawn ◽  
A. M. Belu ◽  
J. M. DeSimone ◽  
M. O. Hunt ◽  
...  

2004 ◽  
Vol 18 (4) ◽  
pp. 371-376 ◽  
Author(s):  
Agnès Tempez ◽  
J. A. Schultz ◽  
S. Della-Negra ◽  
J. Depauw ◽  
D. Jacquet ◽  
...  

1991 ◽  
Vol 5 (2) ◽  
pp. 81-85 ◽  
Author(s):  
A. Tsarbopoulos ◽  
B. N. Pramanik ◽  
P. Reichert ◽  
M. M. Siegel ◽  
T. L. Nagabhushan ◽  
...  

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